Abstract: Disclosed is a monolithic transistor circuit for high voltage applications. A high impedance bleed resistor is effectively provided across the emitter-base junction of one of the transistors. This is accomplished by placing the base regions of this and another transistor at a selected distance apart so that the zero bias depletion regions of the bases overlap to produce a punch through condition resulting in a desired current density therebetween when an external bias is supplied. The devices thus produced have a high current carrying capacity with low leakage currents.