Abstract: A device for individually testing semiconductor integrated circuits in wafer form at elevated and/or reduced temperatures include a fixture body for connection to a conventional probing device. The fixture body has an open-ended aperture to permit visual inspection of a circuit being tested, a plenum to receive pressurized gas at a selected temperature(s), and nozzles to direct the gas from the plenum into the aperture for ejection onto to the surface of the integrated circuit being tested to rapdily bring that circuit to the temperature of the gas.

Abstract: A device for individually testing semiconductor integrated circuits in wafer form at elevated and/or reduced temperatures include a fixture body for connection to a conventional probing device. The fixture body has an open-ended aperture to permit visual inspection of a circuit being tested, a plenum to receive pressurized gas at a selected temperature(s), and nozzles to direct the gas from the plenum into the aperture for ejection onto the surface of the integrated circuit being tested to rapidly bring that circuit to the temperature of the gas.

Abstract: Several embodiments of an annular linear induction pump for pumping liquid metals are disclosed having the features of generally one pass flow of the liquid metal through the pump and an increased efficiency resulting from the use of thin duct walls to enclose the stator. The stator components of this pump are removable for repair and replacement.