Abstract: The present invention relates to methods and devices for noninvasive nonlinear prediction of ictal onset in patients afflicted by neurological disease. In particular, the present invention provides methods and devices for noninvasive nonlinear prediction of seizures in patients afflicted with epilepsy. The devices and methods preferably being based on analysis of two or more electroencephalogram (EEG) recordings, one set of recordings taken from an electrode close to the region of ictal onset, and a second or more set of recordings (e.g., concurrent readings) taken from a region remote from the region of ictal onset.