Abstract: An oral-care implement having a longitudinal axis, a bristle carrier, and a plurality of cleaning including a spring-loaded cleaning element movably disposed in a channel formed in the bristle carrier and comprising a spring portion disposed in the channel and a projecting portion longitudinally adjacent to the spring portion and outwardly extending from the channel at an angle of projection relative to the longitudinal axis. The spring portion can elastically deform inside the channel to conform to the channel's shape, thereby causing the projecting portion to change its length and angle of projection.

Abstract: A prober system comprises a chuck, sensor and processing circuit. The chuck is configured to horizontally move a semiconductor wafer having a plurality of dies to position a selected group of the dies for parallel testing and vertically move the wafer to press the selected group of dies in contact with probes of a tester probe card. The sensor is configured to measure the vertical movement of the chuck when the wafer is on the chuck. The processing circuit is configured to control the horizontal and vertical movement of the chuck to test different groups of the dies, determine a total number of touchdowns between the wafer and the probes based on the vertical movement of the chuck measured by the sensor and associate each of the touchdowns with a location of the wafer contacted by the probes during that touchdown. A corresponding test data analysis system is also provided.

Abstract: A prober system comprises a chuck, sensor and processing circuit. The chuck is configured to horizontally move a semiconductor wafer having a plurality of dies to position a selected group of the dies for parallel testing and vertically move the wafer to press the selected group of dies in contact with probes of a tester probe card. The sensor is configured to measure the vertical movement of the chuck when the wafer is on the chuck. The processing circuit is configured to control the horizontal and vertical movement of the chuck to test different groups of the dies, determine a total number of touchdowns between the wafer and the probes based on the vertical movement of the chuck measured by the sensor and associate each of the touchdowns with a location of the wafer contacted by the probes during that touchdown. A corresponding test data analysis system is also provided.

Abstract: A process for finishing textiles with skin-care oils including spraying, onto a textile, an aqueous emulsion with a Brookfield viscosity below 200 mPas at 20° C., including (a) water; (b) one or more skin-care oils; and (c) one or more emulsifiers is provided.

Abstract: A process for finishing textiles, including spraying, onto a textile, an aqueous microcapsule dispersion, including water; microcapsules; one or more polymeric dispersants; and one or more anionic wetting agents, where the wetting agents are different from the one or more polymeric dispersants is provided.