Abstract: The invention relates to a device for crystal orientation measurement, comprising an ion source (42); means (44) for focusing ions emitted from the ion source into an ion probe; and means (18) for receiving a crystalline or multicrystalline sample (16), characterized by an imaging ion detector (12) for registering at least one ion blocking pattern (26) in digital form. The invention further relates to the use of a device according to one of the preceding claims for crystal orientation measurement. The invention further relates to a method for crystal orientation measurement, comprising the focusing of ions emitted from an ion source (42) into an ion probe; directing the ion probe onto a crystalline or multicrystalline sample (16); and registering at least one ion blocking pattern (26) in digital form with the aid of an imaging ion detector (12).