Patents by Inventor Robert Scott Lockhart

Robert Scott Lockhart has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11790519
    Abstract: A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.
    Type: Grant
    Filed: July 28, 2021
    Date of Patent: October 17, 2023
    Assignee: Baker Hughes, A GE Company, LLC
    Inventors: Ritwick Jana, Bryan David Maule, Michael Christopher Domke, thomas Durkee Britton, Robert Scott Lockhart
  • Publication number: 20210366104
    Abstract: A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.
    Type: Application
    Filed: July 28, 2021
    Publication date: November 25, 2021
    Inventors: Ritwick Jana, Bryan David Maule, Michael Christopher Domke, Thomas Durkee Britton, Robert Scott Lockhart
  • Patent number: 11113806
    Abstract: A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.
    Type: Grant
    Filed: May 18, 2020
    Date of Patent: September 7, 2021
    Assignee: Baker Hughes, a GE Company, LLC
    Inventors: Ritwick Jana, Bryan David Maule, Michael Christopher Domke, Thomas D. Britton, Robert Scott Lockhart
  • Publication number: 20200279366
    Abstract: A non-destructive testing (NDT) system can provide a tree model of an inspection on a display of an NDT device and on a web page configured in a web browser on a computing device coupled to the NDT device. Inspection data acquired using the NDT device can be provided in real-time as the inspection data is associated with a node configured in the tree model. The NDT system can generate an inspection tree model based on an inspection template including a template tree model. Defect properties, inspection instructions, and/or image transforms can be applied to nodes of the template tree model such that the generated inspection tree model includes the applied defect properties, inspection instructions, and/or image transforms, which can then be applied to the inspection data acquired at the inspection point location corresponding to each node.
    Type: Application
    Filed: May 18, 2020
    Publication date: September 3, 2020
    Inventors: Ritwick Jana, Bryan David Maule, Michael Christopher Domke, Thomas D. Britton, Robert Scott Lockhart