Abstract: Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Abstract: Described herein is a detector for determining a position of at least one object. The detector includes at least one sensor element having a matrix of optical sensors, the optical sensors each having a light-sensitive area, wherein the sensor element is configured to determine a reflection image of the object. The detector also includes an evaluation device configured to select a reflection feature of the reflection image, and determine a distance estimate of the selected reflection feature of the reflection image by optimizing at least one blurring function fa, wherein the distance estimate is given by a longitudinal coordinate z and an error interval±?. The evaluation device is adapted to determine at least one displacement region in at least one reference image corresponding to the distance estimate, and to match the selected reflection feature with at least one reference feature within the displacement region.

Abstract: Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Abstract: Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Abstract: Described herein is an optical sensor, a detector for an optical detection including the optical sensor, a method for manufacturing the optical sensor and various uses of the optical detector. The optical sensor includes a stack.

Abstract: Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ?2m.

Abstract: Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ?2m.

Abstract: Described herein is an optical sensor, a detector including the optical sensor for an optical detection of at least one object, a method for manufacturing the optical sensor and various uses of the optical detector. The optical sensor can, be supplied as a non-bulky hermetic package which provides an increased degree of protection against possible degradation by humidity and/or oxygen over long terms. Further, the optical sensor may be easily manufactured and integrated on a circuit carrier device.

Abstract: Described herein is a spectrometer device. The spectrometer device is configured for determining at least one spectral or spectroscopic information of at least one object. The spectrometer device is configured for determining intensities of constituent wavelength signals of at least one light beam propagating from the object to the spectrometer device. The spectrometer device includes at least one distance detector configured for determining at least one distance information about a distance between at least one object and the spectrometer device, at least one pixelated imaging detector configured for determining at least one image of the object, and at least one evaluation device configured for determining at least one material information of the object by evaluating of at least one image of the object determined by the pixelated imaging detector. The evaluation device is configured for performing at least one spectroscopic analysis of the determined intensities of constituent wavelength signals.

Abstract: Described herein is a detector for determining a position of at least one object. The detector includes: at least one dichroic filter; at least one optical sensor; and at least one evaluation device. Also described herein are a method for determining a position of the at least one object and a method of using the detector.

Abstract: Described herein is an optical sensor, a detector including the optical sensor for an optical detection of at least one object, a method for manufacturing the optical sensor and various uses of the optical detector. The optical sensor can be supplied as a non-bulky hermetic package which provides an increased degree of protection against possible degradation by humidity and/or oxygen over long terms. Further, the optical sensor may be easily manufactured and integrated on a circuit carrier device.

Abstract: Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ??2m.

Abstract: A medical apparatus having an application device which can be brought into contact with a patient to be treated, and a galvanic isolator which can be connected to the application device, the isolator having at least one application connector for connection to the application device and at least one supply connector for connection to a device. The isolator is configured to galvanically isolate the application connector from the supply connector. The isolator has at least one first radio unit connected to the application connector, and at least one second radio unit connected to the supply connector. The first antenna and second antenna are fixed on a carrier at a visible distance from each other. The at least one first radio unit and the at least one second radio unit are configured to transmit signals and/or data between the application connector and the supply connector.

Abstract: Disclosed herein is a device including at least one photoconductor configured for exhibiting an electrical resistance Rphoto dependent on an illumination of a light-sensitive region of the photoconductor; and at least one photoconductor readout circuit, where the photoconductor readout circuit is configured for determining the electrical resistance Rphoto of the photoconductor, where the photoconductor readout circuit includes at least one bias voltage source configured for applying at least one modulated bias voltage to the photoconductor.

Abstract: Described herein is a measurement head for determining a position of at least one object. The measurement head includes: at least one transfer device; and at least one bundle of optical fibers.

Abstract: Described herein is a spectrometer device for optical analysis of at least one sample. The spectrometer device includes: at least one housing having at least one entrance window; at least one wavelength-selective element configured for separating incident light into a spectrum of constituent wavelengths, the wavelength-selective element being disposed within the housing; at least one detector device configured for detecting at least a portion of the constituent wavelengths, the detector device being disposed within the housing; and at least one contact sensor device for detecting a contact of the spectrometer device with the sample, where the contact sensor device includes at least one optical contact sensor device, where the optical contact sensor device is configured to detect an influence of the presence of the sample onto the transmission of the optical signal.

Abstract: Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ?2m.

Abstract: Described herein is a projector for illuminating at least one object with at least two illumination patterns. The projector includes at least one tunable laser source and at least one diffractive optical element. The projector is configured to generate the at least two illumination patterns each including a plurality of illumination features by controlling at least one property of the tunable laser source. The projector includes at least one control unit. The control unit is configured for controlling the at least one property of the tunable laser source.

Abstract: A device includes at least one array of photoconductors, at least one bias voltage source, and at least one photoconductor readout circuit. Each photoconductor is configured for exhibiting an electrical resistance dependent on an illumination of its light-sensitive region, and at least one photoconductor of the array is designed as characterizing photoconductor. The bias voltage source is configured for applying at least one alternating bias voltage to the characterizing photoconductor or at least one direct current (DC) bias voltage to the characterizing photoconductor. The photoconductor readout circuit is configured for determining of a response voltage of the characterizing photoconductor generated in response to the bias voltage. The response voltage is proportional to a variable characterizing the array of photoconductors. The photoconductor readout circuit configured for determining of the response voltage of the characterizing photoconductor during operation of the array of photoconductors.

Abstract: Described herein is a detector for detecting optical radiation, especially within the infrared spectral range, specifically with regard to sensing at least one of transmissivity, absorption, emission and reflectivity, being capable of avoiding or diminishing a cross detection between sensor areas, specifically between adjacent sensor areas, thus, avoiding or diminishing a deterioration of a measurement based on the at least one sensor signal.