Abstract: In one embodiment, and in response to an ordered sequence of events corresponding to execution of a plurality of tests on at least one device under test (DUT), 1) a plurality of data objects are created, the data objects including A) some data objects that correspond to logical groupings of test results implied by ones of the events, and B) a generic data object that corresponds to a user-defined one of the events; 2) ones of the data objects are related to others of the data objects in a hierarchical tree structure, with the generic data object being related to others of the data objects based on the position of the user-defined event in the ordered sequence of events; and 3) data corresponding to ones of the events is related to ones of the data objects in the hierarchical tree structure. A number of data formatters are provided access to the plurality of data objects and data associated with the hierarchical tree structure. Other embodiments are also disclosed.

Abstract: The present invention eliminates the indexing time of an SOC tester, or at least reduces it to the time delay for an electronic switch to toggle or a mechanical shift to occur between two banks of DUTs to be tested on a DUT load board mounted on a test head.

Abstract: A graphical user interface (GUI) of a report format editor for circuit test displays a number of user-selectable representations of circuit test data. The GUI also displays a user-modifiable ASCII report format that is formed, at least in part, of placed ones of the user-selectable representations of circuit test data. Program code interprets the relative sizes and placements of elements forming the user-modifiable ASCII report format, and generates an ASCII format description file in response to the interpretation. A circuit test system then formats circuit test data in accordance with the ASCII format description file.