Abstract: A method is disclosed which includes: using a scanning interferometry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position of best focus for the buried surface based on the sequence of phase-shifted interferometry images of the object, and generating a final image based on the phase-shifted interferometry images and the scan position, where the interferometric fringes in the final image are reduced relative to the interferometric fringes in the phase-shifted interferometry images.

Abstract: A computer application program can comprise multiple overlapping states associated with functionality or components of the application program. Simultaneous output of all such states can be impractical. Representative states can be defined in terms of the statuses of individual states relevant to a particular representative state. Additionally, representative states can be ranked, where multiple representative states that share the same ranking can overlap with each other, but not with other representative states. To avoid transitioning between states too quickly, and presenting output for too short a time, hysteresis mechanisms can be applied in the form of a set delay, a reset delay or a combination thereof. The duration of the set and reset delay can be established independently of each other and independently for each state. The output can be in accordance with the representative state associated with the current statuses of individual states, accounting for selected hysteresis mechanisms.

Abstract: A computer application program can comprise multiple overlapping states associated with functionality or components of the application program. Simultaneous output of all such states can be impractical. Representative states can be defined in terms of the statuses of individual states relevant to a particular representative state. Additionally, representative states can be ranked, where multiple representative states that share the same ranking can overlap with each other, but not with other representative states. To avoid transitioning between states too quickly, and presenting output for too short a time, hysteresis mechanisms can be applied in the form of a set delay, a reset delay or a combination thereof. The duration of the set and reset delay can be established independently of each other and independently for each state. The output can be in accordance with the representative state associated with the current statuses of individual states, accounting for selected hysteresis mechanisms.

Abstract: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics that relate to one or more under-resolved lateral features of the test object; and outputting information about the under-resolved surface feature based on the comparison.

Abstract: A method is disclosed which includes: using a scanning interferometry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position of best focus for the buried surface based on the sequence of phase-shifted interferometry images of the object, and generating a final image based on the phase-shifted interferometry images and the scan position, where the interferometric fringes in the final image are reduced relative to the interferometric fringes in the phase-shifted interferometry images.

Abstract: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics that relate to one or more under-resolved lateral features of the test object; and outputting information about the under-resolved surface feature based on the comparison.

Abstract: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parameterized by a series of characteristics that relate to one or more under-resolved lateral features of the test object; and outputting information about the under-resolved surface feature based on the comparison.

Abstract: A method is disclosed which includes: using a scanning interferometry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position of best focus for the buried surface based on the sequence of phase-shifted interferometry images of the object, and generating a final image based on the phase-shifted interferometry images and the scan position, where the interferometric fringes in the final image are reduced relative to the interferometric fringes in the phase-shifted interferometry images.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parameterized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.

Abstract: Vector graphics may be flexibly resized. Pins are associated with vector graphics control points, and when a canvas is resized, the pin locations are scaled according to the canvas resizing, and the control points associated with the pin are scaled according to a different positioning scheme. Pins may be fixed in location relative to the pin location, or may scale only in one direction. Control points not associated with a pin are scaled according to the canvas resizing. Other embodiments allow regions to be defined, in which control points are governed by a different positioning scheme, or allow a grid lines to be drawn defining the canvas into slices, where each slice is assigned a specific positioning scheme.

Abstract: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics that relate to one or more under-resolved lateral features of the test object; and outputting information about the under-resolved surface feature based on the comparison.

Abstract: A method is disclosed which includes: using a scanning interferons dry system, generating a sequence of phase-shifted interferometry images at different scan positions of an object comprising a buried surface, identifying a scan position corresponding to a position of best focus for the buried surface based on the sequence of phase-shifted interferometry images of the object, and generating a final image based on the phase-shifted interferometry images and the scan position, where the interferometric fringes in the final image are reduced relative to the interferometric fringes in the phase-shifted interferometry images.

Abstract: In order to work with user interface documents containing instances of reusable templates which describe both the appearance and behavior for a user interface element, editing functionality is provided. The user interface document can be edited by selecting items from a view of the user interface document and indicating an edit to be performed. Edits may be to an underlying template or templates, or to properties of selected items. The scope of the edit is determined by user indication and/or defaults of user preference. Locks are provided in order to prevent accidental editing of some locked element or template. A graphical tree view, a list view (text-based tree view), or an artboard view may be presented to a user in order to facilitate the selection and editing process.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parameterized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics for the test object. The information corresponding to the multiple models may include information about at least one amplitude component of a transform of a scanning interferometry signal corresponding to each of the models of the test object.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.

Abstract: Disclosed is an interferometry analysis method that includes comparing information derivable from multiple interferometry signals corresponding to different surface locations of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parameterized by a series of characteristics that relate to one or more under-resolved lateral features of the test object; and outputting information about the under-resolved surface feature based on the comparison.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.

Abstract: A method including comparing information derivable from a scanning interferometry signal for a first surface location of a test object to information corresponding to multiple models of the test object, wherein the multiple models are parametrized by a series of characteristics for the test object. The derivable information being compared may relate to a shape of the scanning interferometry signal for the first surface location of the test object.