Abstract: For interfacing a random-access (microprocessor-type) device to a sequential-access type device, such as EISA (Extended Industry Standard Architecture)-bus-memory (RAM) cell array (110), employed is a dual-port random-access-memory (RAM) cell array (110), for storing/retrieving words of data and a set of command and status registers (COMMAND/STATUS REGS) (160). Also employed is a combination of a set of end-address registers (END ADD #1-2) (162), a set of comparators (COMPARATOR) (164), and a set of next-address registers (NEXT ADD #1-2) (166), the combination permitting the sequential-access and random-access dual-port memory buffer (100) to jump from one dual-port random-access-memory (RAM) cell-array (110) sequential address, stored in an end address register (END ADD #1-2) (162) to another dual-port random-access-memory (RAM) cell-array (110) sequential address, stored in a next address register (NEXT ADD #1-2) (166).

Abstract: A pair of similar, 32-bit, error detection and correction devices, including a "lower 32-bit" device (210) and an "upper 32-bit" device (212) are configured as a 64-bit, error detection and correction system. When a (64-bit) word of data is being stored in memory, the lower 32-bit device (210) develops, on an inter-device bus (226), signals representing generation partial check bits. The upper 32-bit device (212) receives the partial check bits (226), and develops signals representing final check bits (236) for storage with the corresponding data word in memory (220 and 234). When a (64-bit) word of data is being retrieved from memory, from signals representing check bits retrieved from memory (222), the lower 32-bit device (210) generates on an inter-device bus (224), signals representing correction partial syndromes.

Abstract: Circuit protection devices comprise a PTC conductive polymer element and means for minimizing the adverse effects of carbonaceous dust evolved by the PTC element when it is tripped. An enclosure encloses, but is spaced apart from, the PTC element. In one embodiment at least part of the interior surface of the enclosure is composed of polytetrafluoroethylene, a ceramic or another material which discourages the formation of permanent low resistance paths through carbonaceous material lying on its surface. In another embodiment the enclosure has a large internal surface area compared to the volume of the PTC element. In further embodiments, electrical leads are connected to and pass through the enclosure, and at least one of the leads is insulated along its length and/or the leads pass through opposite ends of the enclosure.

Abstract: Circuit protection devices comprise a PTC conductive polymer element and means for minimizing the adverse effects of carbonaceous dust evolved by the PTC element when it is tripped. An enclosure encloses, but is spaced apart from, the PTC element. In one embodiment at least part of the interior surface of the enclosure is composed of polytetrafluoroethylene, a ceramic or another material which discourages the formation of permanent low resistance paths through carbonaceous material lying on its surface. In another embodiment the enclosure has a large internal surface area compared to the volume of the PTC element. In further embodiments, electrical leads are connected to and pass through the enclosure, and at least one of the leads is insulated along its length and/or the leads pass through opposite ends of the enclosure.

Abstract: Circuit protection devices comprise a PTC conductive polymer element and means for minimizing the adverse effects of carbonaceous dust evolved by the PTC element when it is tripped. An enclosure encloses, but is spaced apart from, the PTC element. In one embodiment at least part of the interior surface of the enclosure is composed of polytetrafluoroethylene, a ceramic or another material which discourages the formation of permanent low resistance paths through carbonaceous material lying on its surface. In another embodiment the enclosure has a large internal surface area compared to the volume of the PTC element. In further embodiments, electrical leads are connected to and pass through the enclosure, and at least one of the leads is insulated along its length and/or the leads pass through opposite ends of the enclosure.

Abstract: Circuit protection devices comprise a PTC conductive polymer element and means for minimizing the adverse effects of carbonaceous dust evolved by the PTC element when it is tripped. An enclosure encloses, but is spaced apart from, the PTC element. In one embodiment at least part of the interior surface of the enclosure is composed of polytetrafluoroethylene, a ceramic or another material which discourages the formation of permanent low resistance paths through carbonaceous material lying on its surface. In another embodiment the enclosure has a large internal surface area compared to the volume of the PTC element. In further embodiments, electrical leads are connected to and pass through the enclosure, and at least one of the leads is insulated along its length and/or the leads pass through opposite ends of the enclosure.