Abstract: Inspection devices nondestructively sense component shape and integrity such as through ultrasonic sensors. Inspection devices include a positional determinator to give orientation of devices relative to the tested object. True distances and relative boundaries of the object are determined with testing and orientation data regardless of rigid or known inspection device position. Inspection data can be corrected for refraction knowing distances and object boundaries. Inspection devices can include additional inspection components like cameras and lighting to match visual inspection with nondestructive testing data spatially and temporally. Inspection devices can be used with self- or manual-propulsion in a working environment with the inspection object. Inspection devices use an operator or computer processor, local or remotely-connected power sources, and communications structures to power and operate the devices.

Abstract: Inspection devices nondestructively sense component shape and integrity such as through ultrasonic sensors. Inspection devices include a positional determinator to give orientation of devices relative to the tested object. True distances and relative boundaries of the object are determined with testing and orientation data regardless of rigid or known inspection device position. Inspection data can be corrected for refraction knowing distances and object boundaries. Inspection devices can include additional inspection components like cameras and lighting to match visual inspection with nondestructive testing data spatially and temporally. Inspection devices can be used with self- or manual-propulsion in a working environment with the inspection object. Inspection devices use an operator or computer processor, local or remotely-connected power sources, and communications structures to power and operate the devices.

Abstract: An apparatus for encoding examination data of an object includes a sensor and a processor. The sensor is configured to sense a position of a target. The target is attached to an inspection system. The processor is configured to encode examination data of the object. The examination data is obtained from the inspection system. The inspection system obtains the examination data by performing an examination of the object. The processor is configured to perform the encoding by determining position information of the inspection system based on the sensed position of the target, and correlating the position information with the examination data.

Abstract: An apparatus for encoding examination data of an object includes a sensor and a processor. The sensor is configured to sense a position of a target. The target is attached to an inspection system. The processor is configured to encode examination data of the object. The examination data is obtained from the inspection system. The inspection system obtains the examination data by performing an examination of the object. The processor is configured to perform the encoding by determining position information of the inspection system based on the sensed position of the target, and correlating the position information with the examination data.