Patents by Inventor Roberto Lissoni

Roberto Lissoni has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060149506
    Abstract: A Design Failure Mode Effect Analysis (DFMEA) method analyzes faults and failures in the design phase of electronic devices. A data-entry mask is used for recording some information concerning the performed analysis and a portion of the recording form is displayed to a user in an electronic display format. The method detects and records past design problems and their corresponding solutions, by a DFMEA method using the data-entry mask form; associates keywords in a database with each problem; associates data concerning each of the design problems, in the same database, including information concerning past fails occurred in similar applications; detects major changes and/or innovations, as well as any improved block or part of a new device with respect to other devices, thereby postulating possible new problems introduced by the new device; and records the new problems and their possible solutions, by the DFMEA method and using the form.
    Type: Application
    Filed: December 5, 2005
    Publication date: July 6, 2006
    Applicant: STMicroelectronics S.r.I.
    Inventors: Giuseppe Cutuli, Francesco Imperiale, Roberto Lissoni, Mario Marchese
  • Patent number: 7035769
    Abstract: A Design Failure Mode Effect Analysis (DFMEA) method analyzes faults and failures in the design phase of electronic devices. A data-entry mask is used for recording some information concerning the performed analysis and a portion of the recording form is displayed to a user in an electronic display format. The method detects and records past design problems and their corresponding solutions, by a DFMEA method using the data-entry mask form; associates keywords in a database with each problem; associates data concerning each of the design problems, in the same database, including information concerning past fails occurred in similar applications; detects major changes and/or innovations, as well as any improved block or part of a new device with respect to other devices, thereby postulating possible new problems introduced by the new device; and records the new problems and their possible solutions, by the DFMEA method and using the form.
    Type: Grant
    Filed: December 26, 2002
    Date of Patent: April 25, 2006
    Assignee: STMicroelectronics S.r.l.
    Inventors: Giuseppe Cutuli, Francesco Imperiale, Roberto Lissoni, Mario Marchese
  • Publication number: 20040128108
    Abstract: Described is a Design Failure Mode Effect Analysis (DFMEA) Method for analyzing faults and failures in the design phase of electronic apparatus and devices. A data-entry mask is used for recording some information concerning the performed analysis and a portion of the recording form is displayed to a user in an electronic display format.
    Type: Application
    Filed: December 26, 2002
    Publication date: July 1, 2004
    Applicant: STMicroelectronics S.r.l.
    Inventors: Giuseppe Cutuli, Francesco Imperiale, Roberto Lissoni, Mario Marchese