Abstract: A DAC cell includes first and second transistors, drain-source coupled at a first node, a gate of the second transistor coupled to a data input (D), and third and fourth transistors, drain-source coupled at a second node, a gate of the fourth transistor coupled to a complement of the data input (DB). The circuit further includes first and second shadow transistors each coupled between the first node and ground, a gate of the first shadow transistor coupled to a switching input (S) and a gate of the second shadow transistor coupled to a complement of the switching input (SB). The circuit still further includes third and fourth shadow transistors each coupled between the second node and ground, a gate of the third shadow transistor coupled to S and a gate of the fourth shadow transistor coupled to SB.

Abstract: Apparatus and associated methods relate to maintaining a total current of a switch cell in a digital-to-analog converter at a controllable operating point by adjusting shunt current control signals applied to programmable shunt current sources in opposite polarity with respect to a tail current control signal applied to a programmable tail current source. In an illustrative example, the total current may flow through differential legs of a switch cell. The programmable shunt current sources may, for example, be configured to compensate for adjustments to the programmable tail current source. In an illustrative example, tail current and shunt currents may flow through a pair of cascode transistors. In various examples, controlling the programmable shunt current sources to compensate adjustments to the tail current source may, for example, permit controlled common mode voltage or operating point so as to reduce device voltage stress over a wider dynamic range of output voltages.

Abstract: Apparatus and associated methods relating to a digital-to-analog converter (DAC) include a programmable resistance network coupled between a voltage supply node VDD and a switch cell circuit to provide a predetermined resistance in response to the VDD and current IS of the switch cell circuit. In an illustrative example, the DAC may include a switch cell circuit comprising one or more switch cells connected in parallel. Each switch cell may include a differential gain circuit having a first branch coupled to a second branch at an input of a current source. The programmable resistance may include a variable resistance configured to adjust a voltage (Vbias) supplied to the switch cell circuit in response to a control signal. By introducing the programmable resistance network, predetermined bias and/or gain values may be dynamically adjusted with a constant board-level power supply VDD.

Abstract: An example timing error measurement system includes a digital-to-analog converter (DAC) having a plurality of current steering circuits, the DAC responsive to a clock signal, a one-bit comparator coupled to a differential output of the DAC, a filter coupled to an output of the one-bit comparator, control logic coupled to an output of the filter, and a delay line coupled to an output of the control logic. An output of the delay line is coupled to an input of the one-bit comparator. The delay line is configured to delay the clock signal.

Abstract: A semiconductor substrate integrated electronic circuit includes a transmitter block and a receiver block connected through a communication network (4). A data signal having a transmission period is generated on a first line that is received by the receiver block. A congestion signal is generated on a second line from the receiver block to the transmitter block when a congestion event of the receiver block occurs in order to interrupt the data signal transmission. A synchro signal is generated on a third line starting from the transmitter block, this synchro signal indicating to the receiver block that the data signal comprises a new datum. The congestion signal also interrupts the synchro signal transmission when a congestion event of the receiver block occurs.

Abstract: The present invention refers to a charge pump system supplied by a direct voltage signal and supplying on the output terminal a voltage signal with a higher value of said direct voltage signal.

Abstract: A semiconductor substrate integrated electronic circuit includes a transmitter block and a receiver block connected through a communication network (4). A data signal having a transmission period is generated on a first line that is received by the receiver block. A congestion signal is generated on a second line from the receiver block to the transmitter block when a congestion event of the receiver block occurs in order to interrupt the data signal transmission. A synchro signal is generated on a third line starting from the transmitter block, this synchro signal indicating to the receiver block that the data signal comprises a new datum. The congestion signal also interrupts the synchro signal transmission when a congestion event of the receiver block occurs.

Abstract: A charge pump for negative voltages, having at least one stage including a high-voltage terminal and a low-voltage terminal; a first branch and a second branch, which are symmetrical and are connected between the high-voltage terminal and the low-voltage terminal and each of which comprises a respective first transistor and a respective second transistor. The first and the second transistors are all triple-well MOS transistors of one and the same polarity type.

Abstract: A charge pump for negative voltages, having at least one stage including a high-voltage terminal and a low-voltage terminal; a first branch and a second branch, which are symmetrical and are connected between the high-voltage terminal and the low-voltage terminal and each of which comprises a respective first transistor and a respective second transistor. The first and the second transistors are all triple-well MOS transistors of one and the same polarity type.

Abstract: The present invention refers to a charge pump system supplied by a direct voltage signal and supplying on the output terminal a voltage signal with a higher value of said direct voltage signal.