Patents by Inventor Roberto SUBRANNI

Roberto SUBRANNI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for the automated assembly of a probe head
    Patent number: 12000879
    Abstract: An apparatus for the automated assembly of a probe head for testing electronic devices integrated on a semiconductor wafer, includes a support adapted to support at least two parallel guides, which are provided with a plurality of respective guides holes, and at least one holding means adapted to hold a contact probe to be housed in the guides holes, of the guides. Suitably, the support is a movable support adapted to be moved according to a preset trajectory between a first position, wherein the contact probe is held by the holding means at a predetermined position outside the guides holes, and a second position wherein the contact probe, which is held at the predetermined position, is housed in a set of guides holes that are substantially concentric to each other.
    Type: Grant
    Filed: August 19, 2020
    Date of Patent: June 4, 2024
    Assignee: TECHNOPROBE S.P.A.
    Inventors: Roberto Subranni, David Heriban, Jean-Christophe Villain, Jocelyn Perreau, Florent Perrocheau, Anne Delettre
  • APPARATUS AND METHOD FOR THE AUTOMATED ASSEMBLY OF A PROBE HEAD
    Publication number: 20200379015
    Abstract: An apparatus for the automated assembly of a probe head for testing electronic devices integrated on a semiconductor wafer, includes a support adapted to support at least two parallel guides, which are provided with a plurality of respective guides holes, and at least one holding means adapted to hold a contact probe to be housed in the guides holes, of the guides. Suitably, the support is a movable support adapted to be moved according to a preset trajectory between a first position, wherein the contact probe is held by the holding means at a predetermined position outside the guides holes, and a second position wherein the contact probe, which is held at the predetermined position, is housed in a set of guides holes that are substantially concentric to each other.
    Type: Application
    Filed: August 19, 2020
    Publication date: December 3, 2020
    Inventors: Roberto SUBRANNI, David HERIBAN, Jean-Christophe VILLAIN, Jocelyn PERREAU, Florent PERROCHEAU, Anne DELETTRE