Abstract: Disclosed herein is a method for parallelized probing of a plurality of samples, a sensor chip for parallelized probing of a plurality of samples, a sensing device for parallelized probing of a plurality of samples, and a measurement system for parallelized probing of a plurality of samples. The method comprises providing a sensor chip, the sensor chip comprising a sensing layer arranged in or on a substrate and a measurement volume adjacent to the sensing layer. The sensing layer comprises a plurality of sensing elements, each of which is configured to generate a sensor signal characterizing a physical observable in the vicinity of the respective sensing element. A carrier fluid comprising a plurality of sample objects is provided to the measurement volume, wherein each of the sample objects comprises or forms a respective sample. A number of sample objects in the measurement volume is controlled such that the sample objects form a self-organized structure in the measurement volume.

Abstract: Disclosed herein is a method for parallelized probing of a plurality of samples, a sensor chip for parallelized probing of a plurality of samples, a sensing device for parallelized probing of a plurality of samples, and a measurement system for parallelized probing of a plurality of samples. The method comprises providing a sensor chip, the sensor chip comprising a sensing layer arranged in or on a substrate and a measurement volume adjacent to the sensing layer. The sensing layer comprises a plurality of sensing elements, each of which is configured to generate a sensor signal characterizing a physical observable in the vicinity of the respective sensing element. A carrier fluid comprising a plurality of sample objects is provided to the measurement volume, wherein each of the sample objects comprises or forms a respective sample. A number of sample objects in the measurement volume is controlled such that the sample objects form a self-organized structure in the measurement volume.