Patents by Inventor Robin Ruck

Robin Ruck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe station adapter for backside emission inspection
    Patent number: 5959461
    Abstract: An adapter for holding a silicon wafer in an inverted position of a probe station to allow backside emission testing is described. The wafer is positioned in a carrier having an opening therethrough for backside emission testing while the wafer is energized and probed beneath the carrier. A special probe card holder is provided with a self-leveling feature by means of a leveling frame on the probe card holder cooperating with the wafer carrier.
    Type: Grant
    Filed: July 14, 1997
    Date of Patent: September 28, 1999
    Assignee: Wentworth Laboratories, Inc.
    Inventors: John Brown, Matthew J. Costello, Luciano P. DosSantos, Robin Ruck