Patents by Inventor Rocco Calabro

Rocco Calabro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11784657
    Abstract: An analog-to-digital device includes a sampling circuit for sampling an input signal. The sampling circuit stops sampling in response to obtaining a trigger signal. The analog-to-digital device includes an analog-to-digital converter circuit which includes an analog to digital converter (ADC) for converting a sampled input provided from the sampling circuit to digital output.
    Type: Grant
    Filed: November 23, 2021
    Date of Patent: October 10, 2023
    Assignee: Infineon Technologies AG
    Inventors: Ketan Dewan, Rocco Calabro, Juergen Schaefer, David Schaffenrath
  • Patent number: 11668763
    Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
    Type: Grant
    Filed: May 9, 2022
    Date of Patent: June 6, 2023
    Assignee: Infineon Technologies AG
    Inventors: Ketan Dewan, Rocco Calabro, Juergen Schaefer
  • Publication number: 20220276323
    Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
    Type: Application
    Filed: May 9, 2022
    Publication date: September 1, 2022
    Inventors: Ketan Dewan, Rocco Calabro, Juergen Schaefer
  • Publication number: 20220179012
    Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
    Type: Application
    Filed: December 8, 2020
    Publication date: June 9, 2022
    Inventors: Ketan Dewan, Rocco Calabro, Juergen Schaefer
  • Patent number: 11353517
    Abstract: An analog fault detection circuit is disclosed. The analog fault detection circuit comprises an input terminal, an input circuit path coupled to the input terminal at a first end and a first sampling switch coupled to the second end of the input circuit path. The first sampling switch is configured to sample an input path voltage at the second end of the input circuit path to provide a first analog to digital converter (ADC) input voltage. The analog fault detection circuit further comprises a first ADC conversion circuit configured to convert the first ADC input voltage to a first digital ADC output; and a first broken wire detection circuit coupled between the first sampling switch and the first ADC conversion circuit, and configured to adaptively pulldown or pullup the first ADC input voltage, in order to detect a fault associated with a first analog circuit path.
    Type: Grant
    Filed: December 8, 2020
    Date of Patent: June 7, 2022
    Assignee: Infineon Technologies AG
    Inventors: Ketan Dewan, Rocco Calabro, Juergen Schaefer
  • Publication number: 20220166442
    Abstract: An analog-to-digital device includes a sampling circuit for sampling an input signal. The sampling circuit stops sampling in response to obtaining a trigger signal. The analog-to-digital device includes an analog-to-digital converter circuit which includes an analog to digital converter (ADC) for converting a sampled input provided from the sampling circuit to digital output.
    Type: Application
    Filed: November 23, 2021
    Publication date: May 26, 2022
    Inventors: Ketan Dewan, Rocco Calabro, Juergen Schaefer, David Schaffenrath
  • Publication number: 20190326900
    Abstract: A driver circuit for driving a device circuit, including: a diode-connected transistor having a bulk input coupled to a driver supply voltage, coupled between the driver supply voltage and a positive control node, wherein the driver supply voltage is less than a threshold voltage of the device circuit; a capacitor coupled between the positive control node and a signal input, wherein when an input signal received at the signal input is high, a positive control voltage at the positive control node configured to control an input transistor of the device circuit is higher than the threshold voltage of the device circuit.
    Type: Application
    Filed: April 24, 2018
    Publication date: October 24, 2019
    Inventors: Rocco Calabro, Oleg Vitrenko