Patents by Inventor Rocco E. DeStefano

Rocco E. DeStefano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for determining repeatable yield detractors of integrated circuits
    Patent number: 6751765
    Abstract: An exemplary embodiment of the invention is a method for LBIST testing integrated circuit. The method includes generating a plurality of multi-bit test patterns and grouping the multi-bit test patterns by a plurality of test pattern partitions including a first test pattern partition having a first number of bits and a second test pattern partition having second number of bits greater than the first number. The first test pattern partition is applied to the integrated circuit to generate a first signature that is compared to a first reference signature to detect a failure. The second test pattern partition is applied to the integrated circuit to generate a second signature that is compared to a second reference signature to detect a failure in the integrated circuit.
    Type: Grant
    Filed: November 27, 2000
    Date of Patent: June 15, 2004
    Assignee: International Business Machines Corporation
    Inventors: Richard F. Rizzolo, Rocco E. DeStefano, Joseph E. Eckelman, Thomas G. Foote, Steven Michnowski, Franco Motika, Phillip J. Nigh, Bryan J. Robbins