Patents by Inventor Rochit Rajusman

Rochit Rajusman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6668331
    Abstract: An apparatus and method in an event based test system for testing an electronics device under test (DUT). The apparatus includes an event memory for storing timing data and event type data of each event wherein the timing data of a current event is expressed by a delay time from an event immediately prior thereto with use of a specified number of data bits, and an additional delay time inserted in the timing data of a specified event in such a way to establish a total delay time of the current event which is longer than that can be expressed by the specified number of data bits in the event memory. The additional delay time is inserted by replicating the timing data and the event type data of the event immediately prior to the specified event.
    Type: Grant
    Filed: March 24, 2000
    Date of Patent: December 23, 2003
    Assignee: Advantest Corp.
    Inventors: Glen A. Gomes, Anthony Le, James Alan Turnquist, Rochit Rajusman, Shigeru Sugamori