Patents by Inventor Rocio Diaz

Rocio Diaz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7737691
    Abstract: A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
    Type: Grant
    Filed: August 26, 2008
    Date of Patent: June 15, 2010
    Assignee: The University of Chicago
    Inventors: Rex E. Gerald, II, Robert J. Klingler, Jerome W. Rathke, Rocio Diaz, Lela Vukovic
  • Patent number: 7501483
    Abstract: A method, apparatus, and system for constructing uniform macroscopic films with tailored geometric assemblies of molecules on the nanometer scale. The method, apparatus, and system include providing starting molecules of selected character, applying one or more force fields to the molecules to cause them to order and condense with NMR spectra and images being used to monitor progress in creating the desired geometrical assembly and functionality of molecules that comprise the films.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: March 10, 2009
    Assignee: The University of Chicago
    Inventors: Rex E. Gerald, II, Robert J. Klingler, Jerome W. Rathke, Rocio Diaz, Lela Vukovic
  • Publication number: 20080309337
    Abstract: A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
    Type: Application
    Filed: August 26, 2008
    Publication date: December 18, 2008
    Inventors: Rex E. GERALD, II, Robert J. Klingler, Jerome W. Rathke, Rocio Diaz, Lela Vukovic
  • Patent number: 7456630
    Abstract: A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: November 25, 2008
    Assignee: U Chicago Argonne LLC
    Inventors: Rex E. Gerald, II, Robert J. Klingler, Jerome W. Rathke, Rocio Diaz, Lela Vukovic
  • Publication number: 20070123695
    Abstract: A method, apparatus, and system for constructing uniform macroscopic films with tailored geometric assemblies of molecules on the nanometer scale. The method, apparatus, and system include providing starting molecules of selected character, applying one or more force fields to the molecules to cause them to order and condense with NMR spectra and images being used to monitor progress in creating the desired geometrical assembly and functionality of molecules that comprise the films.
    Type: Application
    Filed: July 11, 2006
    Publication date: May 31, 2007
    Inventors: Rex Gerald, Robert Klingler, Jerome Rathke, Rocio Diaz, Lela Vukovic
  • Publication number: 20070063702
    Abstract: A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
    Type: Application
    Filed: July 11, 2006
    Publication date: March 22, 2007
    Inventors: Rex Gerald, Robert Klingler, Jerome Rathke, Rocio Diaz, Lela Vukovic