Patents by Inventor Rocky D. Kruger

Rocky D. Kruger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for sample separation and lift-out with one cut
    Patent number: 6420722
    Abstract: When a desired portion is separated from an integrated circuit chip or a semiconductor wafer, the portion is separated so that the resulting sample can be moved to a location for examination by TEM, SEM or other means. A sample portion of the chip or wafer containing an area of interest is separated with a single cut by a focused ion-beam. Prior to separation, the sample is fixed to a micromanipulator probe. The sample is moved by the probe to the location for examination and fixed there. The probe is then detached from the sample by the focused ion-beam.
    Type: Grant
    Filed: May 23, 2001
    Date of Patent: July 16, 2002
    Assignee: Omniprobe, Inc.
    Inventors: Thomas M. Moore, Rocky D. Kruger, Cheryl Hartfield
  • Method for sample separation and lift-out
    Publication number: 20010045511
    Abstract: When a desired portion is separated from an integrated circuit chip or a semiconductor wafer, the portion is separated so that the resulting sample can be moved to a location for examination by TEM, SEM or other means. A sample portion of the chip or wafer containing an area of interest is separated with a single cut by a focused ion-beam. Prior to separation, the sample is fixed to a micromanipulator probe. The sample is moved by the probe to the location for examination and fixed there. The probe is then detached from the sample by the focused ion-beam.
    Type: Application
    Filed: May 23, 2001
    Publication date: November 29, 2001
    Inventors: Thomas M. Moore, Rocky D. Kruger, Cheryl Hartfield