Patents by Inventor Roderic L. Osgood

Roderic L. Osgood has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron-beam probing of photodiodes
    Patent number: 4730158
    Abstract: Method and apparatus for testing photodiode arrays using an electron beam. The diodes are charged at successive intervals over the RC time constant curve to develop successively increasing voltages at the ends of succeeding time intervals. Diode voltage and current are measured at the end of each interval and the resulting data are used to develop a current-voltage characteristic for each diode.
    Type: Grant
    Filed: June 6, 1986
    Date of Patent: March 8, 1988
    Assignee: Santa Barbara Research Center
    Inventors: Ichiro Kasai, Roderic L. Osgood, Charley B. Burgett, Richard J. Joyce, Michael D. Warfield
  • Voltage calibration in E-beam probe using optical flooding
    Patent number: 4695794
    Abstract: Method and apparatus for calibrating equipment used for testing photodiode arrays by reference to the diode under test. The diodes are illuminated with infrared radiation and different bias voltages, developed by bombardment with an electron beam, are measured at zero current. The measured voltage values are correlated with secondary emission sensor readouts to calibrate the sensor according to the specific diode being tested. Remote light emitting diodes generate the infrared radiation which is coupled to the photodiode array via optical fiber elements.
    Type: Grant
    Filed: May 31, 1985
    Date of Patent: September 22, 1987
    Assignee: Santa Barbara Research Center
    Inventors: Charley B. Bargett, Roderic L. Osgood, Joseph L. Davis, Richard J. Joyce