Patents by Inventor Roderick Alan Augur
Roderick Alan Augur has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11837547Abstract: A photonic integrated circuit (PIC) die includes a silicon nitride optical component over an active region. Multiple interconnect layers are over the silicon nitride optical component, each of the multiple interconnect layers including a metal interconnect therein. At least one optical deflector is over the multiple interconnect layers and over the silicon nitride optical component. The optical deflector(s) may also include a contact passing therethrough to the interconnect layers, but do not include any other electrical interconnects. Each optical deflector may deflect light within an ambient light range of less than 570 nanometers (nm) to protect the silicon nitride optical component from light-induced degradation.Type: GrantFiled: October 8, 2021Date of Patent: December 5, 2023Assignee: GLOBALFOUNDRIES U.S. Inc.Inventors: Roderick Alan Augur, Yusheng Bian, Robert John Fox, III
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Publication number: 20230113261Abstract: A photonic integrated circuit (PIC) die includes a silicon nitride optical component over an active region. Multiple interconnect layers are over the silicon nitride optical component, each of the multiple interconnect layers including a metal interconnect therein. At least one optical deflector is over the multiple interconnect layers and over the silicon nitride optical component. The optical deflector(s) may also include a contact passing therethrough to the interconnect layers, but do not include any other electrical interconnects. Each optical deflector may deflect light within an ambient light range of less than 570 nanometers (nm) to protect the silicon nitride optical component from light-induced degradation.Type: ApplicationFiled: October 8, 2021Publication date: April 13, 2023Inventors: Roderick Alan Augur, Yusheng Bian, Robert John Fox, III
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Patent number: 10181420Abstract: Semiconductor devices and methods of fabricating the semiconductor devices with chamfer-less via multi-patterning are disclosed. One method includes, for instance: obtaining an intermediate semiconductor device; performing a trench etch into a portion of the intermediate semiconductor device to form a trench pattern; depositing an etching stack; performing at least one via patterning process; and forming at least one via opening into a portion of the intermediate semiconductor device. An intermediate semiconductor device is also disclosed.Type: GrantFiled: February 6, 2017Date of Patent: January 15, 2019Assignee: GLOBALFOUNDRIES Inc.Inventors: Jason Eugene Stephens, David Michael Permana, Guillaume Bouche, Andy Wei, Mark Zaleski, Anbu Selvam K M Mahalingam, Craig Michael Child, Jr., Roderick Alan Augur, Shyam Pal, Linus Jang, Xiang Hu, Akshey Sehgal
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Patent number: 10090258Abstract: One illustrative crack-stop structure disclosed herein may include a first crack-stop metallization layer comprising a first metal line layer that has a plurality of openings formed therein and a second crack-stop metallization layer positioned above and adjacent the first crack-stop metallization layer, wherein the second crack-stop metallization layer has a second metal line layer and a via layer, and wherein the via layer comprises a plurality of vias having a portion that extends at least partially into the openings in the first metal line layer of the first crack-stop metallization layer so as to thereby form a stepped, non-planar interface between the first metal line layer of the first crack-stop metallization layer and the via layer of the second crack-stop metallization layer.Type: GrantFiled: September 25, 2017Date of Patent: October 2, 2018Assignee: GLOBALFOUNDRIES Inc.Inventors: Kevin Boyd, Robert Fox, Jeannine Trewhella, Roderick Alan Augur, Nicholas A. Polomoff
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Publication number: 20180226294Abstract: Semiconductor devices and methods of fabricating the semiconductor devices with chamfer-less via multi-patterning are disclosed. One method includes, for instance: obtaining an intermediate semiconductor device; performing a trench etch into a portion of the intermediate semiconductor device to form a trench pattern; depositing an etching stack; performing at least one via patterning process; and forming at least one via opening into a portion of the intermediate semiconductor device. An intermediate semiconductor device is also disclosed.Type: ApplicationFiled: February 6, 2017Publication date: August 9, 2018Applicant: GLOBALFOUNDRIES Inc.Inventors: Jason Eugene STEPHENS, David Michael PERMANA, Guillaume BOUCHE, Andy WEI, Mark ZALESKI, Anbu Selvam KM MAHALINGAM, Craig Michael CHILD, JR., Roderick Alan AUGUR, Shyam PAL, Linus JANG, Xiang HU, Akshey SEHGAL
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Publication number: 20180102315Abstract: The surface area of a surface area-dependent semiconductor device is increased by providing a dielectric layer, removing portion(s) of the dielectric layer, resulting in recession(s), and forming surface area-dependent semiconductor device(s), a portion of the device being formed along a sidewall of one, or more, of the recession(s). The resulting semiconductor structure includes a dielectric layer having recession(s) therein, and surface area-dependent semiconductor device(s) having a portion thereof formed along a sidewall of the recession(s).Type: ApplicationFiled: October 11, 2016Publication date: April 12, 2018Inventors: Roderick Alan AUGUR, Roger A. QUON, Shawn P. FETTEROLF
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Patent number: 9576735Abstract: A capacitor structure includes a first metal layer including a first plurality of horizontally-spaced neutral conductive lines positioned horizontally between a first plurality of horizontally-spaced high voltage conductive lines. The capacitor structure further includes a second metal layer including a second plurality of horizontally-spaced neutral conductive lines positioned horizontally between a second plurality of horizontally-spaced high voltage conductive lines. The capacitor structure further includes a third metal layer positioned vertically below the first metal layer and above the second metal layer, the third metal layer including a third plurality of horizontally-spaced neutral conductive lines positioned horizontally between a first plurality of horizontally-spaced low voltage conductive lines. The first plurality of low voltage lines are positioned vertically between the first and second plurality of neutral lines.Type: GrantFiled: June 6, 2014Date of Patent: February 21, 2017Assignee: GLOBALFOUNDRIES Inc.Inventors: Roderick Alan Augur, Jason Eugene Stephens
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Patent number: 9431294Abstract: Integrated circuits and methods for producing the same are provided. A method for producing an integrated circuit includes forming an interconnect trench in a dielectric layer, and forming a conformal barrier layer overlying the dielectric layer and within the interconnect trench. A barrier spacer is formed by removing the conformal barrier layer from an interconnect trench bottom, and an interconnect is formed within the interconnect trench after forming the barrier spacer. An air gap trench is formed in the dielectric layer adjacent to the barrier spacer, and a top cap is formed overlying the interconnect and the air gap trench, where the top cap bridges the air gap trench to produce an air gap in the air gap trench.Type: GrantFiled: October 28, 2014Date of Patent: August 30, 2016Assignee: GLOBALFOUNDRIES, INC.Inventors: Ming He, Errol Todd Ryan, Roderick Alan Augur, Craig Child, Larry Zhao
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Publication number: 20160118292Abstract: Integrated circuits and methods for producing the same are provided. A method for producing an integrated circuit includes forming an interconnect trench in a dielectric layer, and forming a conformal barrier layer overlying the dielectric layer and within the interconnect trench. A barrier spacer is formed by removing the conformal barrier layer from an interconnect trench bottom, and an interconnect is formed within the interconnect trench after forming the barrier spacer. An air gap trench is formed in the dielectric layer adjacent to the barrier spacer, and a top cap is formed overlying the interconnect and the air gap trench, where the top cap bridges the air gap trench to produce an air gap in the air gap trench.Type: ApplicationFiled: October 28, 2014Publication date: April 28, 2016Inventors: Ming He, Errol Todd Ryan, Roderick Alan Augur, Craig Child, Larry Zhao
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Publication number: 20150357120Abstract: A capacitor structure includes a first metal layer including a first plurality of horizontally-spaced neutral conductive lines positioned horizontally between a first plurality of horizontally-spaced high voltage conductive lines. The capacitor structure further includes a second metal layer including a second plurality of horizontally-spaced neutral conductive lines positioned horizontally between a second plurality of horizontally-spaced high voltage conductive lines. The capacitor structure further includes a third metal layer positioned vertically below the first metal layer and above the second metal layer, the third metal layer including a third plurality of horizontally-spaced neutral conductive lines positioned horizontally between a first plurality of horizontally-spaced low voltage conductive lines. The first plurality of low voltage lines are positioned vertically between the first and second plurality of neutral lines.Type: ApplicationFiled: June 6, 2014Publication date: December 10, 2015Inventors: Roderick Alan Augur, Jason Eugene Stephens
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Patent number: 9147659Abstract: A metallization arrangement for an integrated circuit is provided with a plurality of pads, such as bondpads and a dielectric layer. These pads are separated from each other by gaps. Reinforcing structures between the gaps mechanically reinforce the dielectric layer and reduce the potential for cracking, especially when a low k dielectric layer is employed.Type: GrantFiled: December 27, 2005Date of Patent: September 29, 2015Assignee: Advanced Micro Devices, Inc.Inventor: Roderick Alan Augur
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Patent number: 8946914Abstract: A method for forming CA power rails using a three mask decomposition process and the resulting device are provided. Embodiments include forming a horizontal diffusion CA power rail in an active layer of a semiconductor substrate using a first color mask; forming a plurality of vertical CAs in the active layer using second and third color masks, the vertical CAs connecting the CA power rail to at least one diffusion region on the semiconductor substrate, spaced from the CA power rail, wherein each pair of CAs formed by one of the second and third color masks are separated by at least two pitches.Type: GrantFiled: March 4, 2013Date of Patent: February 3, 2015Assignee: GLOBALFOUNDRIES Inc.Inventors: Jason Eugene Stephens, Marc L. Tarabbia, Nader Magdy Hindawy, Roderick Alan Augur
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Publication number: 20140246791Abstract: A method for forming CA power rails using a three mask decomposition process and the resulting device are provided. Embodiments include forming a horizontal diffusion CA power rail in an active layer of a semiconductor substrate using a first color mask; forming a plurality of vertical CAs in the active layer using second and third color masks, the vertical CAs connecting the CA power rail to at least one diffusion region on the semiconductor substrate, spaced from the CA power rail, wherein each pair of CAs formed by one of the second and third color masks are separated by at least two pitches.Type: ApplicationFiled: March 4, 2013Publication date: September 4, 2014Applicant: GLOBALFOUNDRIES Inc.Inventors: Jason Eugene STEPHENS, Marc L. Tarabbia, Nader Magdy Hindawy, Roderick Alan Augur