Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Abstract: A hydraulically operated attachment for a skid loader or the like provides for the easy removal of large trees and the lifting of other heavy objects. The lift attachment includes a frame, a base portion extending forward from the bottom of the frame, a lifter portion hingedly attached to the top of the frame, and a hydraulic cylinder for moving the lifter portion from a down position to a raised position.

Abstract: A rotating riding toy for children has adjustability in the linkage which causes the riding toy to rotate. It has been found that such adjustability can affect the ease of pumping or driving the riding toy rotationally as well as the rotational speed obtained. In addition, the seats are positionally adjustable to accommodate smaller and larger children. Quick release pins are envisioned for removing stabilizing legs from a base member to afford breakdown of the mechanism and portability.