Patents by Inventor Rodney Browen

Rodney Browen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4652814
    Abstract: A circuit tester and test technique are presented that compresses the amount of data stored in local test data RAMs for the implementation of a circuit test, thereby reducing the amount of data that must be downloaded to the local test data RAMs, thereby improving test throughput. Derivative data vectors are utilized in addition to raw data vectors as part of the data compression technique. Further compression results from storing only unique data vectors in the local test data RAMs and utilizing a sequencer to control the order in which the unique data vectors are utilized. The sequencer includes test program logic and logic capable of implementing on test pins indirect counters.
    Type: Grant
    Filed: June 13, 1983
    Date of Patent: March 24, 1987
    Assignee: Hewlett-Packard Company
    Inventors: William A. Groves, Matthew L. Snook, Rodney Browen
  • Patent number: 4642561
    Abstract: A circuit tester and test technique are presented that compresses the amount of data stored in local test data RAMs for the implementation of a circuit test, thereby reducing the amount of data that must be downloaded to the local test data RAMs, thereby improving test throughput. Derivative data vectors are utilized in addition to raw data vectors as part of the data compression technique. Further compression results from storing only unique data vectors in the local test data RAMs and utilizing a sequencer to control the order in which the unique data vectors are utilized. The sequencer includes test program logic and logic capable of implementing on test pins indirect counters.
    Type: Grant
    Filed: January 3, 1984
    Date of Patent: February 10, 1987
    Assignee: Hewlett-Packard Company
    Inventors: William A. Groves, Matthew L. Snook, Rodney Browen
  • Patent number: 4598245
    Abstract: A circuit tester and test technique are presented that compresses the amount of data stored in local test data RAMs for the implementation of a circuit test, thereby reducing the amount of data that must be downloaded to the local test data RAMs, thereby improving test throughput. Derivative data vectors are utilized in addition to raw data vectors as part of the data compression technique. Further compression results from storing only unique data vectors in the local test data RAMs and utilizing a sequencer to control the order in which the unique data vectors are utilized. The sequencer includes test program logic and logic capable of implementing on test pins indirect counters.
    Type: Grant
    Filed: January 3, 1984
    Date of Patent: July 1, 1986
    Assignee: Hewlett-Packard Company
    Inventors: William A. Groves, Matthew L. Snook, Rodney Browen