Abstract: The invention relates to a method for the correction or compensation of individual differences between the conversion characteristics of the image sensors (11) and the processing units (12) of an X-ray detector which are connected thereto. It is assumed that a functional relationship in conformity with GW=Fi(Lij(?)) exists between the quantity of radiation (?) entering the detector and the grey value (GW) resulting therefrom for a pixel (j, i), where Lij describes the approximately linear behavior of the sensor arrangement (10) and Fi the non-linear behavior of the processing unit (12). For the inverse value Lij?1 a linear model function is used and for the inverse value Fi?1 a non-linear model function is used with parameters which can be calculated from calibration measurements with different radiation quantities (?k).

Abstract: The invention relates to a method for the correction or compensation of individual differences between the conversion characteristics of the image sensors (11) and the processing units (12) of an X-ray detector which are connected thereto. It is assumed that a functional relationship in conformity with GW=Fi(Lij(&phgr;)) exists between the quantity of radiation (&phgr;) entering the detector and the grey value (GW) resulting therefrom for a pixel (j, i), where Lij describes the approximately linear behavior of the sensor arrangement (10) and Fi the non-linear behavior of the processing unit (12). For the inverse value Lij−1 a linear model function is used and for the inverse value Fi−1 a non-linear model function is used with parameters which can be calculated from calibration measurements with different radiation quantities (&phgr;k).