Abstract: A slit m is projected onto an object surface in which reference point X1 is in a horizontal axis x closest to in focus point P. One image of a field of view area F is acquired after reflection of light comprising said reference point X1. Position Z1 of the object in a vertical axis z is determined. Images of respective field of view areas F are acquired after reflection of light having reference points X2, X3 . . . Xn by simultaneously moving the object along axis z to maintain reference points X2, X3 . . . Xn closest to in focus point P. Positions Z2, Z3 . . . Zn in which images were acquired are determined. The in focus point P along horizontal axis x is determined for each image. A correction differential ?1, ?2 . . . ?n between in focus point P and reference points X1, X2 . . . Xn is calculated.

Abstract: The device has an apparatus for rotatably holding and positioning at least one stent-like object and a unit for illuminating at least inner and outer surfaces thereof, including at least a wide field epi illumination device and a diffuse back illumination device for simultaneously illuminating the stent-like object. The illumination unit may further include diffuse side illumination device for inspecting side surfaces of the stent-like object. An apparatus for acquiring images of the stent-like object including at least one microscope objective lens and at least one camera is also provided.

Abstract: A slit m is projected onto an object surface in which reference point X1 is in a horizontal axis x closest to best in focus position P. One image of a field of view area F is acquired after reflection of light comprising said reference point X1. Position Z1 of the object in a vertical axis z is determined. Images of respective field of view areas F are acquired after reflection of light having reference points X2, X3 . . . Xn by simultaneously moving the object along axis z to maintain reference points X2, X3 . . . Xn closest to best in focus position P. Positions Z2, Z3 . . . Zn in which images were acquired are determined. The best in focus position P along horizontal axis x is determined for each image. A correction differential ?1, ?2 . . . ?n between best in focus position P and reference points X1, X2 . . . Xn is calculated.

Abstract: The device comprises a light source (LED), beam splitters, illumination pattern generating mechanism and interchangeable microscope lenses that are lenses that may be used to obtain confocal images and lenses that may be used to obtain interferometric images. The generating mechanism can generate a sequence of illumination patterns to obtain confocal images, or total opening of all the illumination pixels to obtain interferometric images.

Abstract: The device comprises a light source (LED), beam splitters, illumination pattern generating mechanism and interchangeable microscope lenses that are lenses that may be used to obtain confocal images and lenses that may be used to obtain interferometric images. The generating mechanism can generate a sequence of illumination patterns to obtain confocal images, or total opening of all the illumination pixels to obtain interferometric images.

Abstract: The invention relates to a method for the optical metrology of conical holes. The inventive method consists in: placing the body comprising the hole in a microscope such that the larger-diametered area of the hole is directed towards lighting means, centring the hole in the field of vision of the observation means, focusing on the smaller-diametered area with the aid of an intense light, and measuring the diameter thereof and the main defects in same. The focusing plane is then changed and the contour of the hole is measured by projecting a series of patterns and measuring the position of points along the contour when the images of the projected pattern and the reflection thereof inside the hole are superimposed in the plane of a camera belonging to the equipment.