Abstract: A method, system, and apparatus for simultaneous physical layer and protocol testing is provided that provides for simultaneous test of many layers of the communication stack at the same time, providing further measurement capability and insight into complex phenomena.

Abstract: A method, system, and apparatus for simultaneous physical layer and protocol testing is provided that provides for simultaneous test of many layers of the communication stack at the same time, providing further measurement capability and insight into complex phenomena.

Abstract: A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

Abstract: A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

Abstract: A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

Abstract: A method and apparatus for providing variable analog to digital converter (ADC) resolution is described.

Abstract: In general, the subject matter described in this disclosure can be embodied in methods, systems, and program products that include presenting, by electronic device, a user interface on a display of the electronic device. The user interface includes a trace of a first waveform, an element that presents multiple properties of the first waveform or a channel on which the first waveform was acquired, a trace of a second waveform, and a second user interface element that presents multiple properties of the second waveform or a channel on which the second waveform was acquired. The electronic device can receive user input that selects the first user interface element and then selects the second user interface element. The electronic device can apply one or more settings of the trace of the first waveform to the trace of the second waveform.

Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.

Abstract: A synchronization apparatus and method for synchronizing a plurality of test and measurement apparatuses or signal generators are provided. A trigger selector is provided or for selecting from a plurality of triggers to be provided to the plurality of test and measurement apparatuses. A trigger enabled input is also provided for receiving a trigger enabled signal from each of the plurality of test and measurement apparatuses and a synchronizing block is provided for generating a single synchronized time stamp signal with the selected trigger and the trigger enabled inputs. A plurality of trigger outputs are also provided for providing the time stamp signal to a trigger input of each of the plurality of test and measurement apparatuses.

Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.

Abstract: A complex acquisition system and method for synchronizing components thereof. The complex acquisition system further including a master acquisition module. The master acquisition module further including an analog to digital acquisition signal generator for generating an analog to digital acquisition signal, a memory acquisition signal generator for generating a memory acquisition signal, a delay calibration signal for generating a delay calibration signal, a step source signal generator for generating a step source signal, and a synchronization module. The complex acquisition system further includes a plurality of slave acquisition modules, each also including a synchronization module. The complex acquisition system additionally includes a distribution system for distributing each of the analog to digital acquisition signal, memory acquisition signal, delay calibration signal and step source signal to each of the synchronization modules in the master and plurality of slave acquisition modules.

Abstract: A complex acquisition system and method for synchronizing components thereof. The complex acquisition system further including a master acquisition module. The master acquisition module further including an analog to digital acquisition signal generator for generating an analog to digital acquisition signal, a memory acquisition signal generator for generating a memory acquisition signal, a delay calibration signal for generating a delay calibration signal, a step source signal generator for generating a step source signal, and a synchronization module. The complex acquisition system further includes a plurality of slave acquisition modules, each also including a synchronization module. The complex acquisition system additionally includes a distribution system for distributing each of the analog to digital acquisition signal, memory acquisition signal, delay calibration signal and step source signal to each of the synchronization modules in the master and plurality of slave acquisition modules.

Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.

Abstract: A complex acquisition system and method for synchronizing components thereof. The complex acquisition system further including a master acquisition module. The master acquisition module further including an analog to digital acquisition signal generator for generating an analog to digital acquisition signal, a memory acquisition signal generator for generating a memory acquisition signal, a delay calibration signal for generating a delay calibration signal, a step source signal generator for generating a step source signal, and a synchronization module. The complex acquisition system further includes a plurality of slave acquisition modules, each also including a synchronization module. The complex acquisition system additionally includes a distribution system for distributing each of the analog to digital acquisition signal, memory acquisition signal, delay calibration signal and step source signal to each of the synchronization modules in the master and plurality of slave acquisition modules.

Abstract: A complex acquisition system and method for synchronizing components thereof. The complex acquisition system further including a master acquisition module. The master acquisition module further including an analog to digital acquisition signal generator for generating an analog to digital acquisition signal, a memory acquisition signal generator for generating a memory acquisition signal, a delay calibration signal for generating a delay calibration signal, a step source signal generator for generating a step source signal, and a synchronization module. The complex acquisition system further includes a plurality of slave acquisition modules, each also including a synchronization module. The complex acquisition system additionally includes a distribution system for distributing each of the analog to digital acquisition signal, memory acquisition signal, delay calibration signal and step source signal to each of the synchronization modules in the master and plurality of slave acquisition modules.

Abstract: An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.

Abstract: A synchronization apparatus and method for synchronizing a plurality of test and measurement apparatuses or signal generators are provided. A trigger selector is provided or for selecting from a plurality of triggers to be provided to the plurality of test and measurement apparatuses. A trigger enabled input is also provided for receiving a trigger enabled signal from each of the plurality of test and measurement apparatuses and a synchronizing block is provided for generating a single synchronized time stamp signal with the selected trigger and the trigger enabled inputs. A plurality of trigger outputs are also provided for providing the time stamp signal to a trigger input of each of the plurality of test and measurement apparatuses.