Patents by Inventor Roger Frye

Roger Frye has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200290154
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: March 26, 2020
    Publication date: September 17, 2020
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Patent number: 10639745
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: May 5, 2020
    Assignee: SIGMA LABS, INC.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye
  • Publication number: 20190255654
    Abstract: This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensing system that monitors two discrete wavelengths associated with a blackbody radiation curve of the layer of powder; determining temperature variations for an area of the build plane traversed by the scans based upon a ratio of sensor readings taken at the two discrete wavelengths; determining that the temperature variations are outside a threshold range of values; and thereafter, adjusting subsequent scans of the energy source across or proximate the area of the build plane.
    Type: Application
    Filed: February 21, 2019
    Publication date: August 22, 2019
    Applicant: Sigma Labs, Inc.
    Inventors: Darren Beckett, Scott Betts, Martin Piltch, R. Bruce Madigan, Lars Jacquemetton, Glenn Wikle, Mark J. Cola, Vivek R. Dave, Alberto M. Castro, Roger Frye