Patents by Inventor Roger Huazne Tsao

Roger Huazne Tsao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Clocked based method and devices for measuring voltage-variable capacitances and other on-chip parameters
    Patent number: 6838869
    Abstract: A characterization method for a device under test includes applying a bias voltage to a test circuit. The test circuit includes a first transistor coupled to the device under test, a second transistor coupled to the device under test and to the first transistor. A third transistor is coupled to a dummy device, a fourth transistor is coupled to the dummy device and to the third transistor. The transistors are of a common type. The characterization method further includes applying non-overlapping clocking signals to transistors of the test circuit to produce test signals for application to the device under test and detecting a current in one or more transistors from the device under test. The bias voltage is further varied to characterize the device under test.
    Type: Grant
    Filed: April 2, 2001
    Date of Patent: January 4, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: David Michael Rogers, Mimi Xuefeng Qian, Roger Huazne Tsao, Michael Allen Van Buskirk