Abstract: An IC is disclosed which includes multiple sectors, each having a resonant clock distribution structure and a sector clock buffer. The sector clock buffer can drive a clock signal onto the resonant clock distribution structure, in response to received clock signal and control signals. The sector clock buffer includes a first driver circuit, with a first impedance to drive the clock signal during a first portion of first and second clock phases. The first driver circuit may cause oscillation of the resonant clock distribution structure. The sector clock buffer includes a second driver circuit, having a second impedance higher than the first impedance. The second driver circuit may maintain the clock signal during a second portion of the first and second clock phases, in response to the control signal. The second driver circuit may maintain the resonant clock distribution structure at one of two voltages.

Abstract: An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog.

Abstract: An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog.

Abstract: An integrated circuit includes a first clock island, a second clock island, a clock generator, and a first programmable delay element. The first clock island is configured to receive a first clock signal. The second clock island is configured to receive a second clock signal. The clock generator is configured to provide a generated clock signal and the first and second clock signals are based on the generated clock signal. The first programmable delay element is coupled between the clock generator and the first clock island. The first programmable delay element is configured to receive the generated clock signal and provide the first clock signal. The integrated circuit is configured to account for a clock skew between the first and second clock signals when information is transferred between the first and second clock islands.

Abstract: Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.

Abstract: An integrated circuit includes a first clock island, a second clock island, a clock generator, and a first programmable delay element. The first clock island is configured to receive a first clock signal. The second clock island is configured to receive a second clock signal. The clock generator is configured to provide a generated clock signal and the first and second clock signals are based on the generated clock signal. The first programmable delay element is coupled between the clock generator and the first clock island. The first programmable delay element is configured to receive the generated clock signal and provide the first clock signal. The integrated circuit is configured to account for a clock skew between the first and second clock signals when information is transferred between the first and second clock islands.

Abstract: Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.

Abstract: Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.

Abstract: Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.

Abstract: Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.

Abstract: A chip-to-chip digital transmission circuit includes a differential driver portion, a pair of differential signal transmission lines connected to the driver portion, and a receiver portion connected to the transmission lines, an output node of which reproduces a digital bit stream originally presented to a driver side input node, wherein the transmission lines carry both transmitted signal information and DC power for the receiver portion. The driver portion is configured to adjust both the transmitted signal magnitude and the DC power delivered to the receiver portion.

Abstract: A digital logic circuit having multiple inputs and a product-of-sums output uses multi input OR circuits with interacting constant-current and constant-voltage elements to improve voltage transfer characteristics. A second-level arbitration circuit connects to the OR circuits and provides mutually exclusive pull-up and pull-down control signals as a logical function of the states of the OR circuits. An output stage connects to the arbitration circuit. The output stage comprises pull-up and pull-down drivers responsive to the output of the second-level arbitration circuit. The digital logic circuit operates at high speed because its transistors are prevented from entering saturation. The logic circuit is easily expandable and provides a simple and direct method of implementing logic circuits which provide product-of-sums outputs.

Abstract: A new family of memory cells and digital-logic gates use an enhancement-mode driver, a voltage-level shifter, and a current regulator to provide improved noise margins and large logic swings. The voltage-level shifter and the current regulator are connected in series between an input and the control electrode of the driver. The voltage-level shifter establishes a voltage drop which is independent of current, while the current regulator establishes a constant current in the series path to the control electrode which is independent of voltage. The driver is an enhancement-mode device, such as a JFET, MESFET, or BJT.