Abstract: In a method and system for testing a test sample (190), a simulation program (130) is used to augment test results provided by a legacy test system (101). The legacy test system (101) includes a measuring device (110) providing a test input (112) to the test sample (190) and receiving a test output (116) from the test sample (190) in response to the test input (112). The simulation program (130) simulates the test sample (190) by predicting a simulated output (134) of the test sample (190) in response to receiving a simulated input (132). A plurality of simulated failures is simulated in the simulation program (130), with each simulated failure generating a corresponding simulated output. The simulation program (130) includes a model (140) for the measuring device (110), the model (140) providing the simulated input (132). A comparator (160) compares the test output (134) with the simulated output (134) to determine a match.

Abstract: A probe having a built-in reference plane for use with TDR testing includes a conductive sheet member such as a wire mesh which is attached to a ground input of a TDR system. The conductive sheet is located proximate the tip of the test probe and extends radially from an axis of the test probe thereby providing its own reference ground plane.

Abstract: A probe having a built-in reference plane for use with TDR testing is disclosed. The probe includes a conductive sheet member such as a wire mesh which is attached to a ground input of a TDR system. The conductive sheet is located proximate the tip of the test probe and extends radially from an axis of the test probe thereby providing its own reference ground plane.