Patents by Inventor Rogerio de Lemos

Rogerio de Lemos has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of and system for prediction of the state of health of an apparatus
    Patent number: 7815103
    Abstract: A method is describe of predicting the probable future condition of one or more components within an apparatus comprising a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors. The method comprises receiving said sensor information; analyzing the information to ascertain sensor patterns from said sensor information; comparing said sensor patterns with detectors, which are predefined patterns, indicative of the future condition of said one or more components within the apparatus; and classifying said sensor patterns as being indicative of future failure of a component or not based upon a comparison of sensor patterns with said detectors.
    Type: Grant
    Filed: November 29, 2005
    Date of Patent: October 19, 2010
    Assignee: NCR Corporation
    Inventors: Jon Timmis, Rogerio de Lemos, Modupe Ayara, Simon J. Forrest
  • Method of determining the cause of an error state in an apparatus
    Patent number: 7600671
    Abstract: A method is described for determining the cause of an error state for one or more components within an apparatus. The apparatus comprises a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors. The method comprises analysing said sensor information in the form of an error log to ascertain sensor patterns from said sensor information comparing said sensor patterns with detectors, which are predefined patterns, indicative of the condition of said one or more components within the apparatus and classifying said sensor patterns as being indicative of said error state of a component or not based upon a comparison of sensor patterns with said detectors.
    Type: Grant
    Filed: November 29, 2005
    Date of Patent: October 13, 2009
    Assignee: NCR Corporation
    Inventors: Simon J. Forrest, Jon Timmis, Rogerio de Lemos, Modupe Ayara
  • Method of determining the cause of an error state in an apparatus
    Publication number: 20060131380
    Abstract: A method is described for determining the cause of an error state for one or more components within an apparatus. The apparatus comprises a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors. The method comprises analysing said sensor information in the form of an error log to ascertain sensor patterns from said sensor information comparing said sensor patterns with detectors, which are predefined patterns, indicative of the condition of said one or more components within the apparatus and classifying said sensor patterns as being indicative of said error state of a component or not based upon a comparison of sensor patterns with said detectors.
    Type: Application
    Filed: November 29, 2005
    Publication date: June 22, 2006
    Inventors: Simon Forrest, Jon Timmis, Rogerio de Lemos, Modupe Ayara