Abstract: A daily-use garment that is substantially normal in appearance includes a head portion corresponding to a head region of a person, and a body portion corresponding to a torso of the person. The head region is configured to cover the head region of the person with a first flexible chamber positioned in the head portion. A second flexible chamber is positioned in the body portion. A fluid supply device of the daily-use garment includes a container configured to hold a fluid under pressure, a first activation member configured to open the container, and one of a conduit and a nozzle that supplies the fluid from the container. The fluid supply device opens the container and supplies the fluid to at least one of the first flexible chamber and the second flexible chamber, and the daily-use garment is converted from a first state to a second state.

Abstract: An apparatus includes a plurality of semiconductor devices and an electrical input device for applying voltage to the plurality of semiconductor devices. There is a switching array configured to sequentially interconnect the electrical input device to each of the semiconductor devices and disconnect the other semiconductor devices from the electrical input device. The semiconductor device connected to the electrical input device is a device under test that produces a test current and the other semiconductor devices are devices not under test that produce, in the aggregate, a leakage current. There is an output node interconnected to the switching array for enabling the measurement of the test current at the output node. There is also a leakage current compensator connected to the output node and the switching array that is configured to divert the leakage current away from the output node.

Abstract: An apparatus includes a plurality of semiconductor devices and an electrical input device for applying voltage to the plurality of semiconductor devices. There is a switching array configured to sequentially interconnect the electrical input device to each of the semiconductor devices and disconnect the other semiconductor devices from the electrical input device. The semiconductor device connected to the electrical input device is a device under test that produces a test current and the other semiconductor devices are devices not under test that produce, in the aggregate, a leakage current. There is an output node interconnected to the switching array for enabling the measurement of the test current at the output node. There is also a leakage current compensator connected to the output node and the switching array that is configured to divert the leakage current away from the output node.

Abstract: A daily-use garment that is substantially normal in appearance includes a head portion corresponding to a head region of a person, and a body portion corresponding to a torso of the person. The head region is configured to cover the head region of the person with a first flexible chamber positioned in the head portion. A second flexible chamber is positioned in the body portion. A fluid supply device of the daily-use garment includes a container configured to hold a fluid under pressure, a first activation member configured to open the container, and one of a conduit and a nozzle that supplies the fluid from the container. The fluid supply device opens the container and supplies the fluid to at least one of the first flexible chamber and the second flexible chamber, and the daily-use garment is converted from a first state to a second state.

Abstract: A system on chip (SOC) includes a clock generator to provide one or more on-chip reference clocks to a number of physical medium attachments (PMAs) across a common clock bus. The clock generator receives one or more external, off-chip clock lines, from which it generates the on-chip reference clocks. Each of the PMAs may operate data input/output (I/O) channels under a variety of different communications protocols, which can have common or distinct reference clock frequencies. Accordingly, the on-chip reference clocks are generated to provide the required reference clocks to each of the PMAs.

Abstract: A system on chip (SOC) includes a clock generator to provide one or more on-chip reference clocks to a number of physical medium attachments (PMAs) across a common clock bus. The clock generator receives one or more external, off-chip clock lines, from which it generates the on-chip reference clocks. Each of the PMAs may operate data input/output (I/O) channels under a variety of different communications protocols, which can have common or distinct reference clock frequencies. Accordingly, the on-chip reference clocks are generated to provide the required reference clocks to each of the PMAs.