Patents by Inventor Rohit Chatterjee

Rohit Chatterjee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190207560
    Abstract: One example includes a device that is comprised of a pre-power amplifier, a power amplifier, a signal path, and a dynamic bias circuit. The pre-power amplifier amplifies an input signal and outputs a first amplified signal. The power amplifier receives the first amplified signal and amplifies the first amplified signal based on a dynamic bias signal to produce a second amplified signal at an output thereof. The signal path is coupled between an output of the pre-power amplifier and an input of the power amplifier. The dynamic bias circuit monitors the first amplified signal, generates the dynamic bias signal, and outputs the dynamic bias into the signal path.
    Type: Application
    Filed: November 5, 2018
    Publication date: July 4, 2019
    Inventors: Debapriya Sahu, Rohit Chatterjee
  • Patent number: 8351742
    Abstract: Systems and methods for sensing properties of a workpiece and embedding a photonic sensor in metal are disclosed herein. In some embodiments, systems for sensing properties of a workpiece include an optical input, a photonic device, an optical detector, and a digital processing device. The optical input provides an optical signal at an output of the optical input. The photonic device is coupled to the workpiece and to the output of the optical input. The photonic device generates an output signal in response to the optical signal, wherein at least one of an intensity of the output signal and a wavelength of the output signal depends on at least one of thermal characteristics and mechanical characteristics of the workpiece. The optical detector receives the output signal from the photonic device and is configured to generate a corresponding electronic signal.
    Type: Grant
    Filed: October 15, 2010
    Date of Patent: January 8, 2013
    Assignee: The Trustees of Columbia University in the City of New York
    Inventors: Chee Wei Wong, Rohit Chatterjee, Xiaochun Li, Xugang Zhang
  • Publication number: 20110176763
    Abstract: Systems and methods for sensing properties of a workpiece and embedding a photonic sensor in metal are disclosed herein. In some embodiments, systems for sensing properties of a workpiece include an optical input, a photonic device, an optical detector, and a digital processing device. The optical input provides an optical signal at an output of the optical input. The photonic device is coupled to the workpiece and to the output of the optical input. The photonic device generates an output signal in response to the optical signal, wherein at least one of an intensity of the output signal and a wavelength of the output signal depends on at least one of thermal characteristics and mechanical characteristics of the workpiece. The optical detector receives the output signal from the photonic device and is configured to generate a corresponding electronic signal.
    Type: Application
    Filed: October 15, 2010
    Publication date: July 21, 2011
    Applicant: The Trustees of Columbia University in the City of New York
    Inventors: Chee Wei Wong, Rohit Chatterjee, Xiaochun Li, Xugang Zhang
  • Patent number: 7840101
    Abstract: Systems and methods for sensing properties of a workpiece and embedding a photonic sensor in metal are disclosed herein. In some embodiments, systems for sensing properties of a workpiece include an optical input, a photonic device, an optical detector, and a digital processing device. The optical input provides an optical signal at an output of the optical input. The photonic device is coupled to the workpiece and to the output of the optical input. The photonic device generates an output signal in response to the optical signal, wherein at least one of an intensity of the output signal and a wavelength of the output signal depends on at least one of thermal characteristics and mechanical characteristics of the workpiece. The optical detector receives the output signal from the photonic device and is configured to generate a corresponding electronic signal.
    Type: Grant
    Filed: January 3, 2007
    Date of Patent: November 23, 2010
    Assignee: The Trustees of Columbia University in the City of New York
    Inventors: Chee Wei Wong, Rohit Chatterjee, Xiaochun Li, Xugang Zhang
  • Publication number: 20090269002
    Abstract: Systems and methods for sensing properties of a workpiece and embedding a photonic sensor in metal are disclosed herein. In some embodiments, systems for sensing properties of a workpiece include an optical input, a photonic device, an optical detector, and a digital processing device. The optical input provides an optical signal at an output of the optical input. The photonic device is coupled to the workpiece and to the output of the optical input. The photonic device generates an output signal in response to the optical signal, wherein at least one of an intensity of the output signal and a wavelength of the output signal depends on at least one of thermal characteristics and mechanical characteristics of the workpiece. The optical detector receives the output signal from the photonic device and is configured to generate a corresponding electronic signal.
    Type: Application
    Filed: January 3, 2007
    Publication date: October 29, 2009
    Inventors: Chee Wei Wong, Rohit Chatterjee, Xiaochun Li, Xugang Zhang