Patents by Inventor Rohit Patnaik
Rohit Patnaik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 10438225Abstract: Online retailers may operate one or more services configured to detect requests generated by automated agents. A CAPTCHA may be transmitted in response to requests generated by automated agents. The CAPTCHAs may include queries requesting market data corresponding to items offered for sale on an electronic commerce website operated by the online retailer. The response to the queries may be stored by one or more services of the online retailer and used as market data for the electronic commerce website. The market data may be used to notify customers about one or more items offered for sale on the electronic commerce website.Type: GrantFiled: December 18, 2013Date of Patent: October 8, 2019Assignee: Amazon Technologies, Inc.Inventors: William Frank Reading, Rohit Patnaik
-
Patent number: 10217190Abstract: A method for reconstructing one or more high-resolution point spread functions (PSF) from one or more low-resolution images includes acquiring one or more low-resolution images of a wafer, aggregating the one or more low-resolution image patches, and estimating one or more sub-pixel shifts in the one or more low-resolution images and simultaneously reconstructing one or more high-resolution PSF from the aggregated one or more low-resolution image patches.Type: GrantFiled: December 27, 2016Date of Patent: February 26, 2019Assignee: KLA-Tencor CorporationInventors: Helen Liu, Rohit Patnaik, Stephen Osborne
-
Patent number: 10115199Abstract: Techniques, systems, and devices are disclosed for analyzing a reconstructed charged particle image of a volume of interest from charged particle detector measurements to determine a location and boundaries of one or more objects or an orientation of the one or more objects. The technique can include performing a segmentation operation on the reconstructed charged particle image of the volume. The segmentation operation identifies a subset of a set of voxels of the image of the volume as object candidate voxels. The technique can include locating corners of the one or more objects to determine the location, boundaries, or the orientation of the one or more objects. The technique can also include the computation of the center of mass of the one or more objects. The technique can include performing a morphological operation on the image and can include performing a connected-component analysis on the identified object-candidate voxels.Type: GrantFiled: October 6, 2015Date of Patent: October 30, 2018Assignee: Decision Sciences International CorporationInventor: Rohit Patnaik
-
Patent number: 10042079Abstract: Techniques, systems, and devices are disclosed for analyzing a reconstructed charged particle image of a volume of interest from charged particle detector measurements to detect objects within the volume of interest and then extracting features from the detected objects based on their statistical and geometric properties. In one aspect, this technique partitions the reconstructed charged particle image of the volume into a set of voxels, wherein each voxel is associated with an intensity value. The technique next performs a segmentation operation on the said image to identify a subset of the set of voxels as object-candidate voxels for generating objects. The technique then performs a connected-component analysis on the object-candidate voxels to identify one or more objects within the said image of the volume. The technique subsequently extracts a set of object features from each identified object based at least on the statistical and geometric properties of the identified object.Type: GrantFiled: May 7, 2015Date of Patent: August 7, 2018Assignee: Decision Sciences International CorporationInventor: Rohit Patnaik
-
Publication number: 20180182067Abstract: A method for reconstructing one or more high-resolution point spread functions (PSF) from one or more low-resolution images includes acquiring one or more low-resolution images of a wafer, aggregating the one or more low-resolution image patches, and estimating one or more sub-pixel shifts in the one or more low-resolution images and simultaneously reconstructing one or more high-resolution PSF from the aggregated one or more low-resolution image patches.Type: ApplicationFiled: December 27, 2016Publication date: June 28, 2018Inventors: Helen Liu, Rohit Patnaik, Stephen Osborne
-
Patent number: 9985943Abstract: Online retailers may operate one or more services configured to detect request generated by automated agents. A security check may be generate and transmitted in response to requests generated by automated agents. The security checks may be transmitted to a second device registered with the online retailer. The second device may transmit the completed security check to the online retailer for verification before the online retailer processes the request.Type: GrantFiled: December 18, 2013Date of Patent: May 29, 2018Assignee: Amazon Technologies, Inc.Inventors: William Frank Reading, Rohit Patnaik
-
Publication number: 20160104290Abstract: Techniques, systems, and devices are disclosed for analyzing a reconstructed charged particle image of a volume of interest from charged particle detector measurements to determine a location and boundaries of one or more objects or an orientation of the one or more objects. The technique can include performing a segmentation operation on the reconstructed charged particle image of the volume. The segmentation operation identifies a subset of a set of voxels of the image of the volume as object candidate voxels. The technique can include locating corners of the one or more objects to determine the location, boundaries, or the orientation of the one or more objects. The technique can also include the computation of the center of mass of the one or more objects. The technique can include performing a morphological operation on the image and can include performing a connected-component analysis on the identified object-candidate voxels.Type: ApplicationFiled: October 6, 2015Publication date: April 14, 2016Inventor: Rohit Patnaik
-
Publication number: 20150325013Abstract: Techniques, systems, and devices are disclosed for analyzing a reconstructed charged particle image of a volume of interest from charged particle detector measurements to detect objects within the volume of interest and then extracting features from the detected objects based on their statistical and geometric properties. In one aspect, this technique partitions the reconstructed charged particle image of the volume into a set of voxels, wherein each voxel is associated with an intensity value. The technique next performs a segmentation operation on the said image to identify a subset of the set of voxels as object-candidate voxels for generating objects. The technique then performs a connected-component analysis on the object-candidate voxels to identify one or more objects within the said image of the volume. The technique subsequently extracts a set of object features from each identified object based at least on the statistical and geometric properties of the identified object.Type: ApplicationFiled: May 7, 2015Publication date: November 12, 2015Inventor: Rohit Patnaik
-
Patent number: 7925074Abstract: In one implementation, a method for reducing reconstruction artifacts in a combined image constructed of a multiple images is provided. The method may include identifying pixels in images that are in a selected range. The identified pixels are replaced the with a substitute pixel value. The images with the substitute pixel values are combined to form a combined image having reduced reconstruction artifacts.Type: GrantFiled: March 30, 2007Date of Patent: April 12, 2011Assignee: Teradyne, Inc.Inventor: Rohit Patnaik
-
Publication number: 20080298537Abstract: The present invention is claimed as an apparatus and a method for acquiring multi-angle images for a region of interest. The apparatus includes a x-ray source producing a beam of radiation; a surface to support the region of interest that moves the region of interest to at least one location; and a x-ray detector that is moved to location in order to receive a portion of the beam that has passed through the region of interest, the x-ray detector producing from the received portion of the beam an image. In another embodiment a plurality of detectors are used instead and they can each receive a portion of the beam that has passed through the printed circuit board.Type: ApplicationFiled: January 13, 2008Publication date: December 4, 2008Inventor: Rohit Patnaik
-
Publication number: 20080247505Abstract: The present invention is claimed as an apparatus and a method for acquiring multi-angle images for a region of interest. The apparatus includes a x-ray source producing a beam of radiation; a surface to support the region of interest that moves the region of interest to at least two locations; and a x-ray detector located to receive a portion of the beam that has passed through the region of interest, the x-ray detector producing from the received portion of the beam an image. In another apparatus the surface that supports the region of interest and the detector move simultaneously while the x-ray source remains fixed.Type: ApplicationFiled: January 11, 2008Publication date: October 9, 2008Inventors: Rohit Patnaik, Dale Thayer
-
Publication number: 20080130983Abstract: An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.Type: ApplicationFiled: October 31, 2007Publication date: June 5, 2008Inventor: Rohit Patnaik
-
Publication number: 20080089606Abstract: In one implementation, a method for reducing reconstruction artifacts in a combined image constructed of a multiple images is provided. The method may include identifying pixels in images that are in a selected range. The identified pixels are replaced the with a substitute pixel value. The images with the substitute pixel values are combined to form a combined image having reduced reconstruction artifacts.Type: ApplicationFiled: March 30, 2007Publication date: April 17, 2008Inventor: Rohit Patnaik
-
Patent number: 7327870Abstract: An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.Type: GrantFiled: March 14, 2006Date of Patent: February 5, 2008Assignee: Teradyne, Inc.Inventor: Rohit Patnaik
-
Publication number: 20060188141Abstract: An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.Type: ApplicationFiled: March 14, 2006Publication date: August 24, 2006Inventor: Rohit Patnaik
-
Patent number: 7013038Abstract: An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.Type: GrantFiled: November 7, 2000Date of Patent: March 14, 2006Assignee: Teradyne, Inc.Inventor: Rohit Patnaik
-
Patent number: 6996265Abstract: An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.Type: GrantFiled: November 7, 2000Date of Patent: February 7, 2006Assignee: Teradyne, Inc.Inventor: Rohit Patnaik