Patents by Inventor ROKKAM KRISHNA KANTH

ROKKAM KRISHNA KANTH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230215176
    Abstract: This relates generally to a method and a system for spatio-temporal polarization video analysis. The spatio-temporal polarization data is analyzed for a computer vision application such as object detection, image classification, image captioning, image reconstruction or image inpainting, face recognition and action recognition. Numerous classical and deep learning methods have been applied on polarimetric data for polarimetric imaging analysis, however, the available pre-trained models may not be directly suitable on polarization data, as polarimetric data is more complex. Further compared to analysis of the polarimetric images, a significant number of actions can be detected by polarimetric videos, hence analyzing polarimetric videos is more efficient. The disclosure is a spatio-temporal analysis of polarization video.
    Type: Application
    Filed: December 21, 2022
    Publication date: July 6, 2023
    Applicant: Tata Consultancy Services Limited
    Inventors: Rokkam Krishna KANTH, Akshaya Ramaswamy, Achanna Anil Kumar, Jayavardhana Rama Gubbi Lakshminarasimha, Balamuralidhar Purushothaman
  • Publication number: 20230204494
    Abstract: Existing Mueller Matrix polarization techniques that rely only on polarization properties are insufficient for accurate characterization of transparent objects. Embodiments of the present disclosure provide a method and system for Mueller Matrix polarimetric characterization of transparent object using optical properties along with the polarization properties to accurately characterize the transparent object. The polarization properties of are derived from a decomposed Mueller matrix element. Additionally, the method derives the optical properties by further subjecting the decomposed Mueller matrix element to Fresnel’s law-based analysis and a reverse Monte Carlo analysis to extract optical properties such as a material refractive index and a material attenuation index. Optical properties vary with changes in the material property caused due to several factors such as manufacturing defect, aberration, inclusion of an impurity such as bubble or dust etc.
    Type: Application
    Filed: December 15, 2022
    Publication date: June 29, 2023
    Applicant: Tata Consultancy Services Limited
    Inventors: ACHANNA ANIL KUMAR, TAPAS CHAKRAVARTY, SUBHASRI CHATTERJEE, ARPAN PAL, JAYAVARDHANA RAMA GUBBI LAKSHMINARASIMHA, ROKKAM KRISHNA KANTH