Abstract: A digital test point monitoring system for continuously monitoring n digital test points (where "n" is any desired whole integer)--test points which may, for example, be associated with m data processors, computer processing units (CPU's), machine tool controls, or any similar control system (where "m" is any desired whole integer)--and dynamically acquiring n signal values which may, for example, be indicative of performance, utilization (activity) levels, or similar data point parameters; processing such n signal values; and, simultaneously displaying y of such processed n signal values (where "y" is any whole integer from "1" to on the order of "8") on a living display containing y discrete independent channels of digital information each portraying a pseudo real time digital representation of the monitored signal values and a digitally pictorial historic representation of previously monitored signal values over a preselected period of time ranging up to on the order of 90 minutes, or more; and the digital