Patents by Inventor Roland E. Leadon

Roland E. Leadon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ionizing dose hardness assurance technique for CMOS integrated circuits
    Patent number: 6476597
    Abstract: A method for testing IC devices for radiation hardness in a non-destructive manner, comprising subjecting a device under test (DUT) originally in an insensitized state, to a state in which the DUT is more sensitive to adverse effects of ionizing dose radiation and while the DUT is in the more sensitive state, subjecting the DUT to a low level of ionizing radiation to degrade performance of the DUT and electrical testing followed by a restoration of the DUT to its original insensitized state.
    Type: Grant
    Filed: January 18, 2000
    Date of Patent: November 5, 2002
    Assignee: Full Circle Research, Inc.
    Inventors: James P Spratt, Roland E. Leadon