Patents by Inventor Roland Mandl

Roland Mandl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11931273
    Abstract: A method for controlling an artificial orthotic or prosthetic knee joint, on which a lower-leg component is arranged and with which a resistance device is associated, the bending resistance (R) of which resistance device is changed in dependence on sensor data that are determined by at least one sensor during the use of the orthotic or prosthetic knee joint, wherein a linear acceleration (aF) of the lower-leg component is determined, the determined linear acceleration (aF) is compared with at least one threshold value, and, if a threshold value of the linear acceleration (aF) of the lower-leg component is reached, the bending resistance (R) is changed.
    Type: Grant
    Filed: March 15, 2021
    Date of Patent: March 19, 2024
    Assignee: OTTO BOCK HEALTHCARE PRODUCTS GMBH
    Inventors: Roland Auberger, Martin Seyr, Clemens Mandl, Dirk Seifert, Hans Dietl
  • Publication number: 20070105238
    Abstract: A method for processing values from a measurement in a data set, such that there is recognition of corrupted values from the measurement. The method of the present invention is structured in such a manner that the values from a measurement are compared by means of a suitable measure of difference from a predefinable or determinable or model function and are evaluated via a predefinable or determinable error bound for that measure of difference.
    Type: Application
    Filed: January 3, 2007
    Publication date: May 10, 2007
    Inventors: Roland Mandl, Heidi Meyer-Hofer
  • Patent number: 7150016
    Abstract: A method of controlling and visualizing processes, wherein data are produced by means of at least one task and/or thread, and consumed by means of at least one further task and/or thread, is designed with respect to a deterministic behavior without increased costs for software or hardware such that a decoupling of mutually blocking tasks and/or threads occurs in real time systems.
    Type: Grant
    Filed: May 21, 2001
    Date of Patent: December 12, 2006
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Andreas Bauhofer, Heidemarie Meyerhofer, Roland Mandl
  • Patent number: 6571133
    Abstract: A method, in particular for monitoring, controlling and adjusting a process, wherein a signal processing instruction is synthesized on a computer-assisted user interface by arranging and connecting icons (6, 7), and generated by the computer from base modules containing individual instructions, one base module being allocated to each icon (6, 7), and the individual instructions of the selected base modules being linked to one another according to the graphic integration of the symbols (6, 7) for transmitting and/or processing data.
    Type: Grant
    Filed: February 9, 2000
    Date of Patent: May 27, 2003
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Johann Nommer, Erich Fuchs, Bernhard Sick
  • Patent number: 6479990
    Abstract: A method for operating an eddy current sensor (10) with a measuring coil (2) and an evaluation circuit (4) for determining material or geometric parameters of a test object (5), in which the test object (5) is arranged at a distance (d) from the measuring coil (2). The impedance of the measuring coil (2) is evaluated, while the measuring coil (2) is being supplied with an alternating voltage of a predetermined frequency, and the evaluation circuit (4) determines the material and geometric parameters of the test object (5) based on the impedance of the measuring coil (2). The impedance of the measuring coil (2) is determined at an alternating voltage of a first frequency, and the impedance of the measuring coil (2) is determined at an alternating voltage of a second frequency, and the evaluation circuit (4) computes the material and geometric parameters of the test object (5) on the basis of the impedances of the measuring coil (2) at the first and the second frequencies.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: November 12, 2002
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Felix Mednikov, Roland Mandl, Mark Netschaevsky
  • Publication number: 20020004811
    Abstract: A method of controlling and visualizing processes, wherein data are produced by means of at least one task and/or thread, and consumed by means of at least one further task and/or thread, is designed with respect to a deterministic behavior without increased costs for software or hardware such that a decoupling of mutually blocking tasks and/or threads occurs in real time systems.
    Type: Application
    Filed: May 21, 2001
    Publication date: January 10, 2002
    Applicant: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Andreas Bauhofer, Heidemarie Meyerhofer, Roland Mandl
  • Publication number: 20010054896
    Abstract: A method for operating an eddy current sensor (10) with a measuring coil (2) and an evaluation circuit (4) for determining material or geometric parameters of a test object (5), in which the test object (5) is arranged at a distance (d) from the measuring coil (2). The impedance of the measuring coil (2) is evaluated, while the measuring coil (2) is being supplied with an alternating voltage of a predetermined frequency, and the evaluation circuit (4) determines the material and geometric parameters of the test object (5) based on the impedance of the measuring coil (2). The impedance of the measuring coil (2) is determined at an alternating voltage of a first frequency, and the impedance of the measuring coil (2) is determined at an alternating voltage of a second frequency, and the evaluation circuit (4) computes the material and geometric parameters of the test object (5) on the basis of the impedances of the measuring coil (2) at the first and the second frequencies.
    Type: Application
    Filed: June 18, 2001
    Publication date: December 27, 2001
    Applicant: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Felix Mednikov, Roland Mandl, Mark Netschaevsky
  • Patent number: 6288536
    Abstract: An eddy current sensor (1) has at least one measuring coil (2) that can be supplied with an alternating current, and an evaluation circuit (3). The eddy current sensor allows the temperature influences on the impedance of the measuring coil to be reliably compensated with a simple design and an evaluation circuit. For this purpose, the eddy current sensor has a compensating coil (4) which can also be supplied with an alternating current and which is arranged closely to the measuring coil, i.e. in thermal contact therewith, in such a way that the electric fields of compensating coil (4) and measuring coil (2) are orthogonal to each other. More particularly, the measuring coil (2) is in an annular form and the compensating coil (4) is wound around the measuring coil in the form of a torus.
    Type: Grant
    Filed: February 2, 1999
    Date of Patent: September 11, 2001
    Assignee: Microepsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Felix Mednikov, Mark Netschaewsky, Karl Wisspeintner
  • Patent number: 5898304
    Abstract: A sensor arrangement (1) comprising at least one measuring coil (2), at least one voltage source (3) for the measuring coil (2), and an evaluation unit (4) with means for detecting, processing, and evaluating measured signals. This sensor arrangement (1) is used to measure distances and thicknesses substantially independently of the material involved, without the user having to know the physicomathematical relations between the influencing quantities and the measured values. In order to evaluate the measured signals, the evaluation unit (4) of the sensor arrangement comprises a neural network (5) with an input layer, at least one hidden layer, an output layer, and connection weights for the individual layers. The connection weights are determined and stored in a learning phase by measurements taken on a plurality of different suitable learning objects with known actual values.
    Type: Grant
    Filed: March 21, 1997
    Date of Patent: April 27, 1999
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Roland Mandl
  • Patent number: 5606509
    Abstract: The invention relates to the correction of an error-prone measuring signal of a pair of scanning rollers. The measuring signal is influenced by the circularity error of the pair of scanning rollers and/or by the eccentric mounting of the pair of scanning rollers. The pair of scanning rollers is used to measure the thickness of a fiber fleece or fiber sliver on a pre-spinning machine in the textile industry. The occurrence of a periodic error value in the measuring signal due to circularity error and/or eccentricity of the pair of scanning rollers is detected. The error value is stored in a position-related manner for one revolution of the scanning rollers and the stored error value is used in the operation of the scanning rollers within the cycles of rotation for the correction of the current, position-synchronous measuring signals.
    Type: Grant
    Filed: April 22, 1996
    Date of Patent: February 25, 1997
    Assignee: Rieter Ingolstadt Spinnereimaschinenbau AG
    Inventors: Peter Denz, Roland Mandl, Karl Wisspeintner
  • Patent number: 5525903
    Abstract: A sensor arrangement and a method of acquiring properties of the surface layer (3) of a metallic target (2), which allow a nondestructive and substantially distance-independent measurement to be performed, with the requirements to be met by the sensor positioning being minimal. The sensor arrangement (1) comprises a combination of at least one eddy-current sensor (5) with at least one displacement measuring sensor (6), the depth of penetration of the eddy currents generated by the eddy-current sensor (5) corresponding to at least twice the thickness of the surface layer (3), and the displacement measuring sensor (6) serving to determine the distance of the sensor arrangement (1) from the target surface (4).
    Type: Grant
    Filed: August 18, 1994
    Date of Patent: June 11, 1996
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Axel Seikowsky, Andreas Spang
  • Patent number: 5485082
    Abstract: A method of calibrating a thickness measuring device having preferably two noncontacting or scanning displacement measuring sensors (2, 3), which allows to calibrate in a simple manner, at the location of measurement, thickness measuring devices operating by different measuring principles by means of a reference object (7).
    Type: Grant
    Filed: December 10, 1992
    Date of Patent: January 16, 1996
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Karl Wisspeintner, Roland Mandl
  • Patent number: 5477473
    Abstract: A sensor-drive and signal-processing method, wherein the primary side of the sensor is supplied with a preferably oscillating input signal, and the output signal from the secondary side of the sensor is demodulated, if need be, filtered and amplified, is developed for realizing smaller structural designs for sensors and associated electronics such that both the sensor drive on the primary side and the signal conditioning and processing on the secondary side occur in digital form.
    Type: Grant
    Filed: February 1, 1994
    Date of Patent: December 19, 1995
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Heinrich Baumann