Abstract: The present disclosure relates generally to compounds and methods for inhibiting the enzymatic activity of lysine demethylase 4 (KDM4) and treating cancer. Provided herein are substituted pyridine derivative compounds and pharmaceutical compositions comprising said compounds. The subject compounds and compositions are useful for inhibiting lysine demethylase 4. Furthermore, the subject compounds and compositions are useful for the treatment of breast cancer and the like.

Abstract: A self test circuit provides a general statement about the condition of a coupled memory which indicates whether a wanted or unwanted manipulation or alteration of the memory has occurred. The contents of the memory are not derivable from the general statement. The general statement is preferably a "fail" or "pass" statement stating whether a deviation in the contents of the memory with respect to a last executed test has been detected or not. The testing of a non-volatile memory is executed by generating a signature from the contents of the non-volatile memory and comparing the generated signature with a reference value of the signature. When the comparison of the generated signature with the reference value indicates a different, a signal is issued and access to the non-volatile memory is restricted and/or a failure procedure is started. Access to the non-volatile memory is allowed when the comparison signature with the reference value indicates no difference.

Abstract: A method of testing chips having each a plurality of contact pads, the chips are arranged on a semiconductor wafer or on a printed circuit and are tested with a test system having a test head provided with a plurality of probes, the method comprising the steps of: a) moving the test head and the chips towards each other by a distance which is smaller than a predefined maximum length; b) determining the presence of a contact between the probes and the contact pads by performing an electrical test via the probes to yield a predetermined electrical result; and c) repeating steps a) and b) until the electrical test no longer yields the predetermined electrical result or until the predefined maximum length is reached. The invention also provides for a test system for carrying out the inventive method.