Abstract: A microscope has an aperture arrangement that, in order to limit the dimension of a light beam, comprises an aperture opening. The size of the aperture opening is adjustable with the aid of a first aperture member and a second aperture member. At least one of the two aperture members is movable relative to the other aperture member. The aperture members are spaced apart from one another when the aperture opening is closed.

Abstract: A microscope (10) has an aperture arrangement (29) that, in order to limit the dimension of a light beam (41), comprises an aperture opening (37). The size of the aperture opening (37) is adjustable with the aid of a first aperture member (32) and a second aperture member (34). At least one of the two aperture members (32, 34) is movable relative to the other aperture member (32, 34). The aperture members (32, 34) are spaced apart from one another when the aperture opening (37) is closed.

Abstract: The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.

Abstract: A microscope contains a light source that emits illuminating light, and an apparatus that generates an illumination pattern in an image field of the microscope. The illumination patterns serves for photochemical modification of the sample.

Abstract: The present invention concerns a method for the analysis and evaluation of at least three-dimensional specimen data that are preferably detected with a confocal scanning microscope. By way of an unequivocal input of the necessary process parameters, the intention is to extract and output a portion of the detected specimen data, on the basis of which an analysis and evaluation of the three- or multi-dimensional specimen data is possible. The method according to the present invention is characterized in that at least two points (14, 15) of the specimen data set of the detected specimen data are defined; that at least one plane (17) extending through the defined points (14, 15) is extracted from the specimen data set; and that the plane (17) is output, preferably graphically, on an output unit (13).

Abstract: The invention relates to an optical arrangement for transmitting short laser pulses in optical fibers (2), especially for injection into a laser microscope, preferably for use in two-photon laser microscopy. The inventive arrangement comprises a short-pulse laser light source (1) and at least one optical fiber (2). An optical device (3) for temporarily modifying the laser pulses is provided between the laser light source (1) and the optical fiber (2). The optical arrangement is provided for compensating an unintentional fiber dispersion and non-linear effects resulting from high energy densities, mainly self-phase modulation. The invention is characterized in that the optical device (3) is configured as a section which is, for the most part, comprised of a transparent , dispersive medium and which is located in the beam path (4) in front of the optical fiber (2) which serves the time extension of the laser pulses (pulse spreading).

Abstract: The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.

Abstract: The present invention concerns a method for the analysis and evaluation of at least three-dimensional specimen data that are preferably detected with a confocal scanning microscope. By way of an unequivocal input of the necessary process parameters, the intention is to extract and output a portion of the detected specimen data, on the basis of which an analysis and evaluation of the three- or multi-dimensional specimen data is possible. The method according to the present invention is characterized in that at least two points (14, 15) of the specimen data set of the detected specimen data are defined; that at least one plane (17) extending through the defined points (14, 15) is extracted from the specimen data set; and that the plane (17) is output, preferably graphically, on an output unit (13).

Abstract: The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.