Abstract: An exemplary embodiment of the invention is a method of characterizing capacitances of a plurality of integrated circuit interconnects. The method includes coupling a first oscillator to a first integrated circuit interconnect and coupling a second oscillator to a second integrated circuit interconnect. The first oscillator is activated to characterize the sum of (i) coupling capacitance between the first integrated-circuit interconnect and the second integrated-circuit interconnect and (ii) ground capacitance between the first integrated-circuit interconnect and a ground. In addition, both of the first oscillator and the second oscillator are activated to characterize the ground capacitance between the first integrated-circuit interconnect and the ground.

Abstract: An asymmetrical delay generator for use in a clock chopping circuit is disclosed. The circuit has a complementary transistor switch memory cell in it. That cell is operated in a mode where one half of the cell operates in saturation mode. That half of the cell controls the pulse width of the chopper. The other half of the cell is not operated in saturation and controls the resetting of the chopper and hence the maximum clock rate at which the circuit will operate.