Abstract: What is described is a high-frequency integrated circuit provided on a III-V compound semiconductor, wherein an emitting device is radiation-coupled with the integrated circuit such that the emitting device irradiates the integrated circuit, and wherein the integrated circuit has at least one of an oscillator, a mixer, a phase shifter, a frequency divider or an amplifier.

Abstract: What is described is a high-frequency integrated circuit provided on a III-V compound semiconductor, wherein an emitting device is radiation-coupled with the integrated circuit such that the emitting device irradiates the integrated circuit, and wherein the integrated circuit has at least one of an oscillator, a mixer, a phase shifter, a frequency divider or an amplifier.

Abstract: A pin electronic adapted for use in an automatic test equipment for testing integrated circuits ICs includes a driver circuit having an input for receiving an input signal from a data source and an output connected with an input pin of a device under test, and a feedback circuit having at least one input, which receives an input voltage or current at the input pin of the DUT, and an output. The feedback circuit is adapted to provide a voltage in order to force a substantially constant voltage or current at the input pin of the DUT, and a switching device for alternatively connecting the input of the driver circuit with the data source or the output of the feedback circuit.

Abstract: For modeling a first device, a measured electrical behavior in at least one of time and frequency domain is received, wherein the measured electrical behavior at least substantially represents at least a portion of the electrical behavior of the first device. The first device is modeled by using a circuit with one or more circuit device, wherein each circuit device has a known model for its electrical behavior, and the circuit substantially represents the measured electrical behavior of the first device. The modeling comprises a step of approximating the measured signal response by sections of a curve.

Abstract: The invention relates to a pin electronic adapted for use in an automatic test equipment—ATE—for testing integrated circuits—ICs—, comprising: a driver circuit having an input for receiving an input signal from a data source and an output connected with an input pin of a device under test—DUT—, a feedback circuit having at least one input, which receives an input voltage or current at the input pin of the DUT, and an output, wherein the feedback circuit is adapted to provide a voltage in order to force a substantially constant voltage or current at the input pin of the DUT, and switching means for alternatively connecting the input of the driver circuit with the data source or the output of the feedback circuit.

Abstract: For modeling a first device, a measured electrical behavior in at least one of time and frequency domain is received, wherein the measured electrical behavior at least substantially represents at least a portion of the electrical behavior of the first device. The first device is modeled by using a circuit with one or more circuit device, wherein each circuit device has a known model for its electrical behavior, and the circuit substantially represents the measured electrical behavior of the first device. The modeling comprises a step of approximating the measured signal response by sections of a curve.