Abstract: In order to provide a sensor that is employable in an advantageous manner and which comprises at least one sensitive element and a housing within which the at least one sensitive element is arranged, it is proposed that at least one RFID data carrier be arranged below a surface of the housing, said data carrier storing sensor properties in a non-volatile manner and being adapted to be read out in a non-contact making manner.

Abstract: In order to provide a sensor that is employable in advantageous manner and which comprises at least one sensitive element and a housing within which the at least one sensitive element is arranged, it is proposed that at least one RFID data carrier be arranged below a surface of the housing, said data carrier storing sensor properties in non-volatile manner and being adapted to be read out in non-contact making manner.

Abstract: Multiple limit switch comprising telescope plungers (16), each of which has a U-shaped anti-rotation element (62) engaging over the inner end of the plunger, this anti-rotation element comprising a hole (68) for the inner portion (44) of the plunger to pass through and forming an abutment for the plunger return spring (70). The outer portion (40) of the plunger has a collar (56; 56'), behind which projections (64) of the anti-rotation element (62) engage, this outer portion (40) having lateral flattened portions (58; 58') to secure the outer portion (40) of the plunger against relative rotation. The flattened portions abut against slide guide surfaces (60) of the anti-rotation element (62) or edges (64') of the latter. The anti-rotation element (62) is non-rotatably held in an inner groove (30) of the limit switch housing (10).

Abstract: An inductive proximity switch with a built-in testing circuit for monitoring movable elements in which an oscillator has an inductive control element, the impedance of which varies in response to approaching elements with a built-in electrical tester for monitoring the correct functioning of the proximity switch wherein the tester has an electrically switchable damping circuit for damping the oscillator for test purposes.