Abstract: A first variant of a sensor element for ascertaining at least one physical or chemical measurement variable, includes: a planar substrate having a first surface and a second surface opposite the first side; one or more sensor structures, which are applied to the first surface of the substrate or on an insulation layer applied to the first surface of the substrate; a passivation layer that at least partially covers the sensor structure or the sensor structures; at least two electrical contact surfaces that are each connected to the sensor structure; a spacer layer applied to one or more first portions of the second surface of the substrate; and a sinterable and/or solderable metal layer applied to one or more second portions of the second surface of the substrate and/or on the spacer layer, wherein a layer thickness of the spacer layer is greater than or equal to a layer thickness of the sinterable and/or solderable metal layer.

Abstract: A method for developing or improving a process for producing a product from a material comprising steps of acquiring process data from at least two different sources for the production process and its relevant parameters by using a Data Collecting computer; using the acquired process data related to the production process to perform a Process Mapping step by using a Process Mapping computer; assigning the acquired process data related to the relevant parameters of the production process to its corresponding process parts by performing a Data Mapping step by using a Data Mapping computer; analyzing the therefore mapped process data with a specific software performed on an Analyzing computer thereby identifying and validating one or more existing characteristics related to the quality or performance of the production process; and using the identified and validated characteristics to develop the production process or improve its performance.

Abstract: A method and a system for improving a production process of a product via a computer wherein the computer runs a software performing a machine learning model which is used to predict target production process parameters based on specific input data of the production process and therefore trained with a specific training dataset regarding that input data and target parameters, and finally the predicted target parameters are used to improve the production process, wherein the machine learning model predicts at least two different target parameters at the same time and is therefore trained with a joint training data set adapted to the at least two target parameters.

Abstract: A method for developing or improving a process for producing a product from a material comprising steps of acquiring raw material data from at least two different sources for the production process and its relevant parameters by using a Data Collecting computer; using the acquired raw material data related to the production process to perform a Process Mapping step by using a Process Mapping computer; assigning the acquired raw material data related to the relevant parameters of the production process to its corresponding process parts by performing a Data Mapping step by using a Data Mapping computer; analyzing the therefore mapped process description with a specific software performed on an Analyzing computer thereby identifying and validating one or more existing characteristics related to the quality or performance of the production process; and using the identified and validated characteristics to develop the production process or improve its performance.

Abstract: A method for developing or improving a process for producing a product from a material comprising steps of acquiring process data from at least two different sources for the production process and its relevant parameters by using a Data Collecting computer; using the acquired process data related to the production process to perform a Process Mapping step by using a Process Mapping computer; assigning the acquired process data related to the relevant parameters of the production process to its corresponding process parts by performing a Data Mapping step by using a Data Mapping computer; analyzing the therefore mapped process data with a specific software performed on an Analyzing computer thereby identifying and validating one or more existing characteristics related to the quality or performance of the production process; and using the identified and validated characteristics to develop the production process or improve its performance.

Abstract: Proposed is a device for the adjustment of parameters and/or operating conditions in electric shop apparatuses, in particular for transmitting frequency adjustment in transmitting modules for the transmission of measured values. For the power supply, the shop apparatus (31) is equipped with a chargeable storage battery (21), which can be charged via charging equipment (20) and a separate charger (22). Charging equipment (20) and charger (22) are designed for the additional transmission of adjustment signals from an adjustment unit (32). Furthermore, a control unit (16) is provided, which converts the received adjustment signals to electric switching signals for adjusting the respective parameter and/or operating conditions. With this, parameters and operating conditions can be adjusted without having to provide manual switches at the shop apparatus (31).

Abstract: A pair of complementary VMOS transistors connected in push-pull is utilized to convert pulses supplied to the gates of these transistors into two-level output signals of which each of the voltage levels is independently adjustable. A digital-to-analog converter is connected to each of the VMOS transistor channels inputs, so that the two voltage levels in question can be set and changed by digital input to the converters provided by a microprocessor. Controlling the d.c. levels of output pulses by a microprocessor makes possible the testing of electronic circuits utilizing different kinds of electronic logic with a single test unit. The selection of the voltage levels of the output pulses to match the type of logic of the circuits to which the pulses are applied can be made through the microprocessor in response to a signal representative of the supply voltage of the circuits under test.