Abstract: A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analysis with multiple characteristic energy lines are possible without any need for conversion or switchover.

Abstract: A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed from a mixed configuration of at least two metals is characterized in that an energy-dispersive semi-conductor is used for acquiring detector events from the X-rays emanating from the sample, and that X-rays diffracted or scattered by the sample with different characteristic energy lines belonging to the metals of the mixed configuration of the X-ray anode used, are acquired simultaneously during an angle scan. With this method, X-ray diffractometry analyses with multiple characteristic energy lines are possible without any need for conversion or switchover.

Abstract: A sample changer (2) for the automatic intake of a multitude of samples into the measurement position on the goniometer axis (a) of an X-ray diffractometer (20) in which the individual samples--each showing a surface, which meets the goniometer axis at a tangent in the measurement position--are linearly arranged on an insertable magazine (3). The samples on the magazine (3) can be moved in the direction of the goniometer axis (a) in order to transport each sample translationally into the measurement position. Furthermore the sample changer (2), the magazine (3) and the mountings (10) show recesses, which allow the refracted X-ray beams from the sample in transmission mode to pass through to the detector (14) unimpeded. The sample changer is suitable for reflection mode as well as transmission mode measurements without having to redesign the system.

Abstract: An X-ray diffractometer having a simple yet accurate means for locating the surface of the sample to be examined with respect to the zero point of the X-ray (RS) is disclosed. Briefly stated, a laser (LA) and camera (KA) are positioned at preferably 90.degree. with respect to each other such that the intersection of the optical axis of the camera and the laser passes through the zero point of the diffractometer. In this fashion, the camera will see at its center, the zero point of the X-ray despite the fact that the X-ray is of course invisible to the naked eye. Accordingly, by movement of the sample (P) with respect to this camera image, the true and correct zero point of the X-ray with respect to the surface of the sample to be examined may be determined without the need for experimental and unnecessary X-ray or examination runs being taken.