Patents by Inventor Rolf V. Criegern

Rolf V. Criegern has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for the compensation of charges in secondary ion mass spectrometry (SIMS) of specimens exhibiting poor electrical conductivity
    Patent number: 4645929
    Abstract: A method and an apparatus are provided for the compensation of charges in the secondary ion mass spectrometry of specimens exhibiting poor electrical conductivity. A scanning ion gun and an electron gun allow secondary ion mass spectra specimens exhibiting poor electrical conductivity to be registered under better-defined conditions than heretofore possible. The electron beam of the electron gun is focused to approximately the same diameter as the ion beam and impinges approximately the same point on the surface of the specimen as the ion beam.
    Type: Grant
    Filed: January 31, 1985
    Date of Patent: February 24, 1987
    Assignee: Siemens Aktiengesellschaft
    Inventors: Rolf V. Criegern, Ingo Weitzel