Abstract: Disclosed is a method of controlling a calculation device via a mobile element to generate at least one control command associated with its vectorial orientation. The mobile element includes sensors able to provide relative measurements and absolute measurements. The method includes the following steps: provision of an initial vectorial orientation; taking of measurements by the set of sensors; determination of a first elementary vectorial orientation from relative measurements and the prior vectorial orientation; determination of a second elementary vectorial orientation from absolute measurements; determination of the current vectorial orientation from the first and second elementary vectorial orientations; and association of a control command.

Abstract: Disclosed is a method of controlling a calculation device via a mobile element to generate at least one control command associated with its vectorial orientation. The mobile element includes sensors able to provide relative measurements and absolute measurements. The method includes the following steps: provision of an initial vectorial orientation; taking of measurements by the set of sensors; determination of a first elementary vectorial orientation from relative measurements and the prior vectorial orientation; determination of a second elementary vectorial orientation from absolute measurements; determination of the current vectorial orientation from the first and second elementary vectorial orientations; and association of a control command.

Abstract: The invention relates to a method for exposing an integrated circuit by ablating the polymer coating initially covering the integrated circuit, characterized in that it includes the combined application of a laser radiation and a plasma onto the coating initially covering the integrated circuit.

Abstract: A wind-powered device for producing electrical energy includes an electric generator set (1) which works by converting mechanical energy into the electrical energy, a wind-powered set (3) designed to capture the energy of the wind and convert it into mechanical energy, a transmission (2) positioned between the wind-powered set (3) and the generator set (1), the transmission (2) being designed to transmit mechanical energy produced by the wind-powered set (3) to the generator set (1), characterized in that the wind-powered set (3) includes at least two air turbines known as wind turbines (4) including non-coaxial shafts (5) coupled to the transmission (3), the wind turbines (4) being designed in such a way as to present an equivalent surface area to the wind that exceeds the surface area exposed to the wind of each of the wind turbines (4).

Abstract: The invention relates to a method for analyzing an integrated circuit, including a step for applying laser radiation at a point on the surface of the circuit, a step for exciting the circuit thus subjected to laser radiation by applying an electrical excitation signal, a step for collecting the response of the circuit to the excitation, the circuit being subjected to laser radiation, and a step for measuring the phase difference between the response to the excitation of the circuit subjected to laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. The invention also relates to an associated observation method and installation.

Abstract: A wind-powered device for producing electrical energy includes an electric generator set (1) which works by converting mechanical energy into the electrical energy, a wind-powered set (3) designed to capture the energy of the wind and convert it into mechanical energy, a transmission (2) positioned between the wind-powered set (3) and the generator set (1), the transmission (2) being designed to transmit mechanical energy produced by the wind-powered set (3) to the generator set (1), characterized in that the wind-powered set (3) includes at least two air turbines known as wind turbines (4) including non-coaxial shafts (5) coupled to the transmission (3), the wind turbines (4) being designed in such a way as to present an equivalent surface area to the wind that exceeds the surface area exposed to the wind of each of the wind turbines (4).

Abstract: A method for analyzing an integrated circuit includes: a step (102) for applying laser radiation at a point on the surface of the circuit; a step (106) for exciting the circuit thus subjected to laser radiation by applying an electrical excitation signal; a step (106) for collecting the response of the circuit to the excitation, the circuit being subjected to laser radiation; a step (106) for measuring the phase difference between the response to the excitation of the circuit subjected to laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. An associated observation method and installation are also disclosed.

Abstract: The invention relates to a method for exposing an integrated circuit by ablating the polymer coating initially covering the integrated circuit, characterised in that it comprises the combined application of a laser radiation and a plasma onto the coating initially covering the integrated circuit.

Abstract: A device (10) for analyzing a circuit (14) includes at least one element (22) for observing light emitted by at least one localized observation zone of the circuit resulting from the electric current flowing in the zone; elements (26) for exciting the circuit. The circuit exciting elements include a laser source (26) and elements (30) for applying a laser beam generated by the source on the observation zone (22). The device includes members (M1, M2) for protecting the observation zone (22) against the incident and reflected laser beams.

Abstract: A method and installation for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, the following steps: applying a laser radiation, in one point of the surface of the integrated circuit; exciting the circuit; collecting the response of the circuit to the excitation; calculating the propagation time intervening between the excitation time and the response-collecting time; and creating an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application.

Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

Abstract: The invention concerns a device (10) for analyzing a circuit (14) comprising: at least one means (22) for observing light emitted by at least one localized observation zone of the circuit resulting from the electric current flowing in said zone; means (26) for exciting the circuit. The circuit exciting means comprise a laser source (26) and means (30) for applying a laser beam generated by the source on the observation zone (22). The device includes means (M1, M2) for protecting the observation means (22) against the incident and reflected laser beams.

Abstract: A device (16) used to measure at least one component of a magnetic field, includes a magnetoresistive sensor (102) and a measuring chain (28). The input of the measuring chain is connected to the magnetoresistive sensor (102), while the output thereof is intended to supply information that is representative of the magnetic field in the region of the sensor. In addition, the measuring chain (28) includes elements (136) for isolating a frequency component of the signal from the sensor representative of the magnetic field for a unique pre-determined frequency (FI).

Abstract: A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors (14, 16) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.

Abstract: A magnetic-field-measuring probe includes at least two magnetoresistive sensors which are sensitive to respective magnetic fields along a determined measurement axis. The at least two magnetoresistive sensors are rigidly connected to one another in a position such that the measurement axes thereof are at an angle other than zero. Output terminals specific to each magnetoresistive sensor are used to supply a signal that is representative of the field measured by each sensor along the measurement axis thereof. The difference between the derivative of a first magnetic field relative to a second direction and the derivative of a second magnetic field relative to a first direction is calculated to determine a component of current to be measured.

Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

Abstract: The invention concerns a method for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, following steps: applying (102) a laser radiation, in one point of the surface of the integrated circuit; exciting (106) the circuit; collecting (108) the response of the circuit to the excitation; calculating (114) the propagation time intervening between the excitation time and the response-collecting time; and creating (116) an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application. The invention also concerns an installation for analyzing an integrated circuit.

Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

Abstract: A magnetic-field-measuring probe includes at least one magnetoresistive or magnetoinductive sensor which is sensitive to the magnetic field along a privileged measurement axis. The probe includes: at least two magnetoresistive or magnetoinductive sensors (14, 16) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are parallel and offset in relation to one another in a direction that is transverse to the privileged measurement axes; and output terminals specific to each magnetoresistive or magnetoinductive sensor, in order to supply a signal that is representative of the magnetic field measured by each sensor along the privileged measurement axis thereof.

Abstract: The invention relates to a magnetic-field-measuring probe comprising at least one magnetoresistive sensor (102, 104, 106) which is sensitive to the magnetic field along a determined privileged measurement axis. The inventive probe comprises: at least two magnetoresistive sensors (102, 104, 106) which are rigidly connected to one another in a position such that the privileged measurement axes thereof are offset angularly; and output terminals specific to each magnetoresistive sensor (102, 104, 106), in order to supply a signal that is representative of the field measured by each sensor along the privileged measurement axis thereof.