Patents by Inventor Roman Rechter

Roman Rechter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Leakage degradation control and measurement
    Patent number: 11703927
    Abstract: A performance management scheme for a processor based on leakage current measurement in field. The scheme performs the operations of detection and correction. The operation of detection measures per core leakage current in the field (e.g., using voltage regulator electrical current counters). The operation of correction changes the processor power management behavior. For example, processor cores showing high leakage degradation may be logically swapped with cores showing low leakage degradation.
    Type: Grant
    Filed: March 27, 2020
    Date of Patent: July 18, 2023
    Assignee: Intel Corporation
    Inventors: Oren Zonensain, Roman Rechter, Almog Reshef, Maxim Levit, Nadav Shulman, Efraim Rotem
  • Control Apparatus, Device, Method and Computer Program for Determining a Device-Specific Supply Voltage for a Semiconductor Device
    Publication number: 20220011795
    Abstract: Examples relate to control apparatus, a control device, a method and a computer program for determining a device-specific supply voltage for a semiconductor device, and to a corresponding semiconductor device and corresponding systems. The control apparatus is configured to obtain measurement data of measurement circuitry of the semiconductor device, the measurement data being related to a progress of aging of the semiconductor device. The control apparatus is configured to determine the device-specific supply voltage of the semiconductor device based on the measurement data. The control apparatus is configured to provide information on the device-specific supply voltage for a supply voltage control apparatus.
    Type: Application
    Filed: September 27, 2021
    Publication date: January 13, 2022
    Inventors: Michael RIFANI, Gregory IOVINO, Roman RECHTER, Grant MCFARLAND, Nasser A. KURD, Eric FETZER, Kurt HENINGER, Qinxin YU, Preethi RAMASWAMY, Monib AHMED, Pauline GOITIA, Narasimha LANKA, Mohammad RASHID, Kit Seong WONG
  • LEAKAGE DEGRADATION CONTROL AND MEASUREMENT
    Publication number: 20200225723
    Abstract: A performance management scheme for a processor based on leakage current measurement in field. The scheme performs the operations of detection and correction. The operation of detection measures per core leakage current in the field (e.g., using voltage regulator electrical current counters). The operation of correction changes the processor power management behavior. For example, processor cores showing high leakage degradation may be logically swapped with cores showing low leakage degradation.
    Type: Application
    Filed: March 27, 2020
    Publication date: July 16, 2020
    Applicant: Intel Corporation
    Inventors: Oren Zonensain, Roman Rechter, Almog Reshef, Maxim Levit, Nadav Shulman, Efraim Rotem